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http://hdl.handle.net/1942/25158
Title: | Impact of potential-induced degradation (PID) on PV parameters | Authors: | CAROLUS, Jorne Govaerts, Jonathan Voroshazi, Eszter DE CEUNINCK, Ward DAENEN, Michael |
Issue Date: | 2017 | Source: | 9th edition Sunday 2017, Bussum - The Netherlands, 8/10/2017 | Abstract: | Potential-induced degradation (PID) is known as a severe degradation phenomenon. PID was first noticed in large photovoltaic (PV) plants where a significant amount of PV modules was connected in series, hence resulting in a significant voltage between the solar cells at one end of the string and the grounded frame. According to Naumann et al., the induced electrical field causes a leakage current and sodium ion (Na+) diffusion into stacking faults through the PN-junction of the solar cell, resulting in a substantial lowering of the shunt resistance. | Document URI: | http://hdl.handle.net/1942/25158 | Category: | C2 | Type: | Conference Material |
Appears in Collections: | Research publications |
Files in This Item:
File | Description | Size | Format | |
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20171030_Carolus_PID.pdf | Conference material | 1.06 MB | Adobe PDF | View/Open |
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