Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/25159
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dc.contributor.authorCAROLUS, Jorne-
dc.contributor.authorVAN DE SANDE, Wieland-
dc.contributor.authorVandenbergh, Thomas-
dc.contributor.authorBakker, Klaas-
dc.contributor.authorMEURIS, Marc-
dc.contributor.authorDAENEN, Michael-
dc.date.accessioned2017-11-13T10:17:52Z-
dc.date.available2017-11-13T10:17:52Z-
dc.date.issued2017-
dc.identifier.citation9th edition Sunday 2017, Bussum - The Netherlands, 8/10/2017-
dc.identifier.urihttp://hdl.handle.net/1942/25159-
dc.description.abstractRecent studies show that thin film photovoltaics (TFPV) are prone to shading damage. When one cell in a TFPV module is shaded, the other cells connected in series will push the current in reverse through the shaded cell. This creates hot spots and eventually breakdown when the power of the other cells in series connected is sufficient. In this poster, we present a model which can be used to determine the impact of interconnection technology on shading damage by TFPV modules.-
dc.language.isoen-
dc.titleProposing a model to investigate the impact of interconnectiontechnology on shading damage by TFPV modules-
dc.typeConference Material-
local.bibliographicCitation.conferencedate8/10/2017-
local.bibliographicCitation.conferencename9th edition Sunday 2017-
local.bibliographicCitation.conferenceplaceBussum - The Netherlands-
local.bibliographicCitation.jcatC2-
local.type.refereedNon-Refereed-
local.type.specifiedPoster-
item.accessRightsOpen Access-
item.fullcitationCAROLUS, Jorne; VAN DE SANDE, Wieland; Vandenbergh, Thomas; Bakker, Klaas; MEURIS, Marc & DAENEN, Michael (2017) Proposing a model to investigate the impact of interconnectiontechnology on shading damage by TFPV modules. In: 9th edition Sunday 2017, Bussum - The Netherlands, 8/10/2017.-
item.fulltextWith Fulltext-
item.contributorCAROLUS, Jorne-
item.contributorVAN DE SANDE, Wieland-
item.contributorVandenbergh, Thomas-
item.contributorBakker, Klaas-
item.contributorMEURIS, Marc-
item.contributorDAENEN, Michael-
Appears in Collections:Research publications
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