Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2536
Title: How reliable are reliability tests?
Authors: Tielemans, L
Rongen, R
DE CEUNINCK, Ward 
Issue Date: 2002
Publisher: PERGAMON-ELSEVIER SCIENCE LTD
Source: MICROELECTRONICS RELIABILITY, 42(9-11). p. 1339-1345
Abstract: Reliability tests are performed for 2 reasons: i. to predict lifetime and ii. to monitor the wafer processes for reliability behaviour. In the prediction of life time large prediction levels can be observed. This large uncertainty is due to different types of errors made during the reliability test and data analysis. All lyrics of errors using the "time to failure" test approach will be discussed and methods are proposed to improve how reliability tests can be improved. (C) 2002 Elsevier Science Ltd. All rights reserved.
Notes: Chiron Pte Ltd, Singapore 757720, Singapore. ESE bvba, B-2260 Westerlo, Belgium. Philips, NL-6534 AE Nijmegen, Netherlands. LUC IMO, B-3590 Diepenbeek, Belgium.Tielemans, L, Chiron Pte Ltd, 21 Woodlands Ind Pk E1 02-06, Singapore 757720, Singapore.
Document URI: http://hdl.handle.net/1942/2536
ISSN: 0026-2714
e-ISSN: 1872-941X
DOI: 10.1016/S0026-2714(02)00146-4
ISI #: 000178889900017
Category: A1
Type: Journal Contribution
Validations: ecoom 2003
Appears in Collections:Research publications

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