Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/27438
Title: Influence of Dopant-Host Energy Level Offset on Thermoelectric Properties of Doped Organic Semiconductors
Authors: Nell, Bernhard
Ortstein, Katrin
Boltalina, Olga V.
VANDEWAL, Koen 
Issue Date: 2018
Publisher: AMER CHEMICAL SOC
Source: JOURNAL OF PHYSICAL CHEMISTRY C, 122(22), p. 11730-11735
Abstract: Increasing the amount of charge carriers by molecular doping is important to improve the function of several organic electronic devices. In this work, we use highly fluorinated fullerene (C60F48) to p-type dope common amorphous molecular host materials. We observe a general relation between the material's electrical conductivity and Seebeck coefficient, both strongly depending on the energy level offset between the amorphous host and the dopant. This suggests that the doping efficiency at similar doping levels is mainly determined by the electron transfer yield from host to dopant. Indeed, the dopant anion and host cation absorption strength correlate with the ionization energy (IE) of the host material. Host materials with an IE significantly below the electron affinity of the dopant yield the highest doping efficiency. Surprisingly, the doping efficiency reduces only by about 1 order of magnitude when the IE of the host material is increased by 0.55 eV, which we attribute to the disordered nature of the host materials.
Notes: [Nell, Bernhard; Ortstein, Katrin; Vandewal, Koen] Tech Univ Dresden, Dresden Integrated Ctr Appl Phys & Photon Mat, D-01062 Dresden, Germany. [Boltalina, Olga V.] Colorado State Univ, Dept Chem, Ft Collins, CO 80523 USA. [Vandewal, Koen] Hasselt Univ, IMEC IMOMEC, Inst Mat Res, B-3590 Diepenbeek, Belgium.
Keywords: Chemistry, Physical; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary
Document URI: http://hdl.handle.net/1942/27438
ISSN: 1932-7447
e-ISSN: 1932-7455
DOI: 10.1021/acs.jpcc.8b03804
ISI #: 000435020300015
Category: A1
Type: Journal Contribution
Validations: ecoom 2019
Appears in Collections:Research publications

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