Please use this identifier to cite or link to this item:
http://hdl.handle.net/1942/28300
Title: | Physics of potential-induced degradation in bifacial p-PERC solar cells | Authors: | CAROLUS, Jorne Tsanakas, John. A. VAN DER HEIDE, Arvid Voroshazi, Eszter DE CEUNINCK, Ward DAENEN, Michael |
Issue Date: | 2019 | Source: | SOLAR ENERGY MATERIALS AND SOLAR CELLS, 200 (Art N° 109950) | Abstract: | The combination of increasing operational voltages beyond 1000 V in photovoltaic (PV) installations and the emergence of new PV technologies requires a critical assessment of the susceptibility to potential-induced degradation (PID). Since this failure mode can trigger significant and rapid power losses, it is considered among the most critical failure modes with a high financial impact. Insights in the physical mechanism of the performance loss and its driving factors are critical to develop adapted characterization methods and mitigation solutions. PID in p-type solar cells is triggered by sodium (Na) that diffuses into stacking faults of the silicon lattice, causing shunt paths through the pn-junction. In addition, it is hypothesised that for bifacial p-PERC solar cells positive charges, such as Na+, accumulate in/on the negatively charged AlOx rear passivation layer due to the potential difference between the glass and the rear cell surface. This significantly increases surface recombination. However, the degradation behaviour observed in bifacial monocrystalline p-PERC solar cells under PID stress from both sides (bifacial PID stress) does not match with just one of the degradation mechanisms. A comprehensive test matrix was carried out to understand the physical origin of PID in front emitter bifacial p-PERC solar cells in a glass/glass packaging. The results show that bifacial p-PERC solar cells under bifacial PID stress suffer from both shunting of the pn-junction and increased surface recombination at their rear side. Hereby, we prove that the glass/glass packaging in combination with bifacial solar cells can significantly increase the severity of PID. | Notes: | Daenen, M (reprint author), Hasselt Univ, Martelarenlaan 42, B-3500 Hasselt, Belgium. michael.daenen@uhasselt.be | Keywords: | Bifacial solar cells; High voltage stress (HVS); Photovoltaic (PV) modules; Potential-induced degradation (PID); p-PERC | Document URI: | http://hdl.handle.net/1942/28300 | ISSN: | 0927-0248 | e-ISSN: | 1879-3398 | DOI: | 10.1016/j.solmat.2019.109950 | ISI #: | 000483633400126 | Rights: | 2019 Elsevier B.V. All rights reserved. | Category: | A1 | Type: | Journal Contribution | Validations: | ecoom 2020 |
Appears in Collections: | Research publications |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
1-s2.0-S092702481930279X-main.pdf Restricted Access | Published version | 1.16 MB | Adobe PDF | View/Open Request a copy |
SCOPUSTM
Citations
5
checked on Sep 3, 2020
WEB OF SCIENCETM
Citations
50
checked on Oct 13, 2024
Page view(s)
98
checked on Jun 9, 2022
Download(s)
92
checked on Jun 9, 2022
Google ScholarTM
Check
Altmetric
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.