Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/28300
Title: Physics of potential-induced degradation in bifacial p-PERC solar cells
Authors: CAROLUS, Jorne 
Tsanakas, John. A.
VAN DER HEIDE, Arvid 
Voroshazi, Eszter
DE CEUNINCK, Ward 
DAENEN, Michael 
Issue Date: 2019
Source: SOLAR ENERGY MATERIALS AND SOLAR CELLS, 200 (Art N° 109950)
Abstract: The combination of increasing operational voltages beyond 1000 V in photovoltaic (PV) installations and the emergence of new PV technologies requires a critical assessment of the susceptibility to potential-induced degradation (PID). Since this failure mode can trigger significant and rapid power losses, it is considered among the most critical failure modes with a high financial impact. Insights in the physical mechanism of the performance loss and its driving factors are critical to develop adapted characterization methods and mitigation solutions. PID in p-type solar cells is triggered by sodium (Na) that diffuses into stacking faults of the silicon lattice, causing shunt paths through the pn-junction. In addition, it is hypothesised that for bifacial p-PERC solar cells positive charges, such as Na+, accumulate in/on the negatively charged AlOx rear passivation layer due to the potential difference between the glass and the rear cell surface. This significantly increases surface recombination. However, the degradation behaviour observed in bifacial monocrystalline p-PERC solar cells under PID stress from both sides (bifacial PID stress) does not match with just one of the degradation mechanisms. A comprehensive test matrix was carried out to understand the physical origin of PID in front emitter bifacial p-PERC solar cells in a glass/glass packaging. The results show that bifacial p-PERC solar cells under bifacial PID stress suffer from both shunting of the pn-junction and increased surface recombination at their rear side. Hereby, we prove that the glass/glass packaging in combination with bifacial solar cells can significantly increase the severity of PID.
Notes: Daenen, M (reprint author), Hasselt Univ, Martelarenlaan 42, B-3500 Hasselt, Belgium. michael.daenen@uhasselt.be
Keywords: Bifacial solar cells; High voltage stress (HVS); Photovoltaic (PV) modules; Potential-induced degradation (PID); p-PERC
Document URI: http://hdl.handle.net/1942/28300
ISSN: 0927-0248
e-ISSN: 1879-3398
DOI: 10.1016/j.solmat.2019.109950
ISI #: 000483633400126
Rights: 2019 Elsevier B.V. All rights reserved.
Category: A1
Type: Journal Contribution
Validations: ecoom 2020
Appears in Collections:Research publications

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