Please use this identifier to cite or link to this item:
http://hdl.handle.net/1942/28610
Title: | Detailed structural and electrical characterization of plated crystalline silicon solar cells | Authors: | Dang, C. Labie, R. Simoen, E. POORTMANS, Jef |
Issue Date: | 2018 | Publisher: | ELSEVIER SCIENCE BV | Source: | SOLAR ENERGY MATERIALS AND SOLAR CELLS, 184, p. 57-66 | Abstract: | In this paper a detailed study on the electrical characteristics of Ni/Cu/Ag plated p-type Passivated Emitter Rear Contact (PERC) silicon solar cells is reported. By comparing the cell performance of different cell groups, pseudo Fill Factor (pFF) degradation by laser-induced defects, is observed. High-power (hard) laser ablated cells exhibit a lower efficiency and faster degradation with thermal ageing. We also present structural and electrical characterization to further visualize and identify the responsible defects, which turn out to be laser-ablation-induced dislocations, penetrating the silicon emitter and base. Increasing the laser fluence gives rise to a higher dislocation density. These dislocations are further confirmed as active generation-recombination centers by Deep Level Transient Spectroscopy (DLTS) analysis. The laser ablation induced dislocations are unavoidable because even at insufficient laser fluence (0.48 J/cm(2)) to fully open the dielectric stack, the density is already at the level of 10(6)/cm(2). A substitutional nickel peak is also detected by DLTS, suggesting nickel diffusing into the silicon base during the sinter step. Whereas no copper levels are found in the p-type silicon base by DLTS even after thermal aging at 235 degrees C. | Notes: | [Dang, C.; Labie, R.; Simoen, E.; Poortmans, J.] IMEC, Kapeldreef 75, B-3001 Leuven, Belgium. [Dang, C.; Poortmans, J.] Katholieke Univ Leuven, Dept Elektrotech ESAT, Kasteelpk Arenberg 10, B-3001 Leuven, Belgium. [Simoen, E.] Univ Ghent, Krijgslaan 281 Si, B-9000 Ghent, Belgium. [Poortmans, J.] Agoralaan Gebouw D, Campus Diepenbeek, UHasselt, B-3590 Diepenbeek, Belgium. | Keywords: | PERC cells; Laser ablation; Ni/Cu/Ag plating; Defects; Reliability; Diffusion;PERC cells; Laser ablation; Ni/Cu/Ag plating; Defects; Reliability; Diffusion | Document URI: | http://hdl.handle.net/1942/28610 | ISSN: | 0927-0248 | e-ISSN: | 1879-3398 | DOI: | 10.1016/j.solmat.2018.04.016 | ISI #: | 000434746800008 | Category: | A1 | Type: | Journal Contribution | Validations: | ecoom 2019 |
Appears in Collections: | Research publications |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
1-s2.0-S0927024818301855-main.pdf Restricted Access | Published version | 4.12 MB | Adobe PDF | View/Open Request a copy |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.