Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/28684
Title: Passivating electron-selective contacts for silicon solar cells based on an a-Si:H/TiOx stack and a low work function metal
Authors: Cho, Jinyoun
Melskens, Jimmy
Debucquoy, Maarten
Payo, Maria Recaman
Jambaldinni, Shruti
Bearda, Twan
GORDON, Ivan 
Szlufcik, Jozef
Kessels, W. M. M.
POORTMANS, Jef 
Issue Date: 2018
Publisher: WILEY
Source: PROGRESS IN PHOTOVOLTAICS, 26(10), p. 835-845
Abstract: In this work, the ATOM (intrinsic a-Si:H/TiOx/low work function metal) structure is investigated to realize high-performance passivating electron-selective contacts for crystalline silicon solar cells. The absence of a highly doped Si region in this contact structure is meant to reduce the optoelectrical losses. We show that a low contact resistivity (rho(c)) can be obtained by the combined effect of a low work function metal, such as calcium (Phi 2.9eV), and Fermi-level depinning in the metal-insulator-semiconductor contact structure (where in our case TiOx acts as the insulator on the intrinsic a-Si:H passivating layer). TiOx grown by ALD is effective to achieve not only a low rho(c) but also good passivation properties. As an electron contact in silicon heterojunction solar cells, inserting interfacial TiOx at the i-a-Si:H/Ca interface significantly enhances the solar cell conversion efficiency. Consequently, the champion solar cell with the ATOM contact achieves a V-OC of 711 mV, FF of 72.9%, J(SC) of 35.1 mA/cm(2), and an efficiency of 18.2%. The achievement of a high V-OC and reasonable FF without the need for a highly doped Si layer serves as a valuable proof of concept for future developments on passivating electron-selective contacts using this structure.
Notes: [Cho, Jinyoun; Poortmans, Jef] Katholieke Univ Leuven, ESAT Dept, B-3001 Leuven, Belgium. [Cho, Jinyoun; Debucquoy, Maarten; Payo, Maria Recaman; Jambaldinni, Shruti; Bearda, Twan; Gordon, Ivan; Szlufcik, Jozef; Poortmans, Jef] Imec, Kapeldreef 75, B-3001 Leuven, Belgium. [Melskens, Jimmy; Kessels, W. M. M.] Eindhoven Univ Technol, Dept Appl Phys, POB 513, NL-5600 MB Eindhoven, Netherlands. [Poortmans, Jef] Univ Hasselt, Martelarenlaan 42, B-3500 Hasselt, Belgium. [Poortmans, Jef] EnergyVille, Thor Pk 8310, B-3600 Genk, Belgium.
Keywords: carrier-selective; electron-selective; heterojunction; passivating contact; TiOx; calcium; low work function metal;carrier‐selective; electron‐selective; heterojunctio; passivating contact; TiOx; calcium; lowworkfunction metal
Document URI: http://hdl.handle.net/1942/28684
ISSN: 1062-7995
e-ISSN: 1099-159X
DOI: 10.1002/pip.3023
ISI #: 000443696500007
Rights: 2018 John Wiley & Sons, Ltd.
Category: A1
Type: Journal Contribution
Appears in Collections:Research publications

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