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http://hdl.handle.net/1942/2905| Title: | Ellipsometric and atomic force microscopic investigations on poly(para-phenylenevinylene) and poly(phenylquinoxaline) thin films | Authors: | Flueraru, C Schrader, S Zauls, V Motschmann, H Stiller, B KIEBOOMS, Rafael |
Issue Date: | 2000 | Publisher: | ELSEVIER SCIENCE SA | Source: | SYNTHETIC METALS, 111. p. 603-606 | Abstract: | We have investigated the optical properties of poly( para-phenylenevinylene) (PPV) prepared via the standard precursor route and poly(phenylquinoxalines) (PPQ). The complex refractive indices are (1,75-i.0.004) for PPQ and (1,62-i.0.002) for PPV. Atomic Force Microscopy and multiple angle of incidence ellipsometric investigations are reported. (C) 2000 Elsevier Science S.A. All rights reserved. | Notes: | Max Planck Inst Kolloid & Grenzflachenforsch, D-12484 Berlin, Germany. Univ Potsdam, Inst Phys, Lehrstuhl Phys Kondensierter Mat, D-14469 Potsdam, Germany. Inst Dunnschichttechnol & Mikrosensor Telto, D-12484 Berlin, Germany. Limburgs Univ Ctr, Inst Mat Onderzoek, B-3590 Diepenbeek, Belgium.Flueraru, C, Max Planck Inst Kolloid & Grenzflachenforsch, Rudower Chaussee 5, D-12484 Berlin, Germany. | Keywords: | experimental methods; ellipsometry; atomic force microscopy; materials | Document URI: | http://hdl.handle.net/1942/2905 | DOI: | 10.1016/S0379-6779(99)00318-5 | ISI #: | 000087496300137 | Category: | A1 | Type: | Journal Contribution | Validations: | ecoom 2001 |
| Appears in Collections: | Research publications |
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