Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2905
Title: Ellipsometric and atomic force microscopic investigations on poly(para-phenylenevinylene) and poly(phenylquinoxaline) thin films
Authors: Flueraru, C
Schrader, S
Zauls, V
Motschmann, H
Stiller, B
KIEBOOMS, Rafael 
Issue Date: 2000
Publisher: ELSEVIER SCIENCE SA
Source: SYNTHETIC METALS, 111. p. 603-606
Abstract: We have investigated the optical properties of poly( para-phenylenevinylene) (PPV) prepared via the standard precursor route and poly(phenylquinoxalines) (PPQ). The complex refractive indices are (1,75-i.0.004) for PPQ and (1,62-i.0.002) for PPV. Atomic Force Microscopy and multiple angle of incidence ellipsometric investigations are reported. (C) 2000 Elsevier Science S.A. All rights reserved.
Notes: Max Planck Inst Kolloid & Grenzflachenforsch, D-12484 Berlin, Germany. Univ Potsdam, Inst Phys, Lehrstuhl Phys Kondensierter Mat, D-14469 Potsdam, Germany. Inst Dunnschichttechnol & Mikrosensor Telto, D-12484 Berlin, Germany. Limburgs Univ Ctr, Inst Mat Onderzoek, B-3590 Diepenbeek, Belgium.Flueraru, C, Max Planck Inst Kolloid & Grenzflachenforsch, Rudower Chaussee 5, D-12484 Berlin, Germany.
Keywords: experimental methods; ellipsometry; atomic force microscopy; materials
Document URI: http://hdl.handle.net/1942/2905
DOI: 10.1016/S0379-6779(99)00318-5
ISI #: 000087496300137
Category: A1
Type: Journal Contribution
Validations: ecoom 2001
Appears in Collections:Research publications

Show full item record

SCOPUSTM   
Citations

15
checked on Sep 3, 2020

WEB OF SCIENCETM
Citations

16
checked on May 21, 2022

Page view(s)

62
checked on May 19, 2022

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.