Ellipsometric and atomic force microscopic investigations on poly(para-phenylenevinylene) and poly(phenylquinoxaline) thin films

Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/2905

Title:	Ellipsometric and atomic force microscopic investigations on poly(para-phenylenevinylene) and poly(phenylquinoxaline) thin films
Authors:	Flueraru, C Schrader, S Zauls, V Motschmann, H Stiller, B KIEBOOMS, Rafael
Issue Date:	2000
Publisher:	ELSEVIER SCIENCE SA
Source:	SYNTHETIC METALS, 111. p. 603-606
Abstract:	We have investigated the optical properties of poly( para-phenylenevinylene) (PPV) prepared via the standard precursor route and poly(phenylquinoxalines) (PPQ). The complex refractive indices are (1,75-i.0.004) for PPQ and (1,62-i.0.002) for PPV. Atomic Force Microscopy and multiple angle of incidence ellipsometric investigations are reported. (C) 2000 Elsevier Science S.A. All rights reserved.
Notes:	Max Planck Inst Kolloid & Grenzflachenforsch, D-12484 Berlin, Germany. Univ Potsdam, Inst Phys, Lehrstuhl Phys Kondensierter Mat, D-14469 Potsdam, Germany. Inst Dunnschichttechnol & Mikrosensor Telto, D-12484 Berlin, Germany. Limburgs Univ Ctr, Inst Mat Onderzoek, B-3590 Diepenbeek, Belgium.Flueraru, C, Max Planck Inst Kolloid & Grenzflachenforsch, Rudower Chaussee 5, D-12484 Berlin, Germany.
Keywords:	experimental methods; ellipsometry; atomic force microscopy; materials
Document URI:	http://hdl.handle.net/1942/2905
DOI:	10.1016/S0379-6779(99)00318-5
ISI #:	000087496300137
Category:	A1
Type:	Journal Contribution
Validations:	ecoom 2001
Appears in Collections:	Research publications

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