Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/31254
Title: Nanostructure stabilization by low-temperature dopant pinning in multiferroic BiFeO3-based thin films produced by aqueous chemical solution deposition
Authors: Gumiel, Carlos
Jardiel, Teresa
Calatayud, David G.
VRANKEN, Thomas 
VAN BAEL, Marlies 
HARDY, An 
Lourdes Calzada, Maria
Jimenez, Ricardo
Garcia-Hernandez, Mar
Mompean, Federico J.
Caballero, Amador C.
Peiteado, Marco
Issue Date: 2020
Publisher: ROYAL SOC CHEMISTRY
Source: JOURNAL OF MATERIALS CHEMISTRY C, 8 (12) , p. 4234 -4245
Abstract: The metastability impediment which usually prevents the obtaining of a phase-pure BiFeO3 material can be dramatically stressed when taking the system to the thin film configuration. In order to preserve the stoichiometry, the films need to be processed at low temperatures and hence the solid-state diffusion processes which usually govern the microstructural evolution in bulk cannot be expected to also rule the development of the functional films. All these circumstances were presumed when exploring the possibilities of an aqueous solution-gel process plus spin-coating deposition method to reproduce, in thin film dimensions, the excellent multiferroic properties that have been previously observed with an optimized rare-earth and Ti4+-codoped BiFeO3 bulk composition. The experiments indicate high reliability for the tested methodology, allowing for the obtaining of homogeneous dense films at temperatures as low as 600 degrees C and with a tunable multiferroic response depending on the formulated rare-earth (Sm or Nd). Thorough structural characterization of the films reveals that despite the low temperature processing restrictions, effective microstructural control is achieved at the nanoscale, which is attributed to effective retention (pinning) of the dopants inside the perovskite structure of BiFeO3.
Notes: Jardiel, T (reprint author), Inst Ceram & Vidrio CSIC, Dept Electroceram, Madrid, Spain.
jardiel@icv.csic.es
Other: Jardiel, T (reprint author), Inst Ceram & Vidrio CSIC, Dept Electroceram, Madrid, Spain. jardiel@icv.csic.es
Keywords: DOPED BIFEO3;ELECTRICAL-PROPERTIES;PHASE-TRANSITION;ND;MICROSTRUCTURE;SUBSTRATE;THICKNESS;CERAMICS;SM
Document URI: http://hdl.handle.net/1942/31254
ISSN: 2050-7526
e-ISSN: 2050-7534
DOI: 10.1039/c9tc05912a
ISI #: WOS:000526888700029
Rights: This article is Open Access. Creative Commons BY license
Category: A1
Type: Journal Contribution
Validations: ecoom 2021
Appears in Collections:Research publications

Files in This Item:
File Description SizeFormat 
carlos.pdfPublished version5.97 MBAdobe PDFView/Open
Show full item record

SCOPUSTM   
Citations

1
checked on Sep 5, 2020

WEB OF SCIENCETM
Citations

9
checked on Apr 14, 2024

Page view(s)

68
checked on Sep 7, 2022

Download(s)

22
checked on Sep 7, 2022

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.