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http://hdl.handle.net/1942/31558| Title: | Recombination Stability in Polycrystalline Cu2ZnSnSe4 Thin Films | Authors: | Buffiere, Marie BRAMMERTZ, Guy El Mel, Abdel-Aziz Lenaers, Nick Ren, Yi Zaghi, Armin E. Mols, Yves Koeble, Christine Vleugels, Jef MEURIS, Marc POORTMANS, Jef |
Issue Date: | 2013 | Publisher: | IEEE | Source: | 2013 IEEE 39TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), IEEE, p. 1941 -1944 | Series/Report: | IEEE Photovoltaic Specialists Conference | Series/Report no.: | 7 | Abstract: | Time-resolved photoluminescence analysis shows that as-grown Cu2ZnSnSe4 (CZTSe) thin films degrade when they are exposed to air. The analysis of the films prior to degradation reveals relatively long carrier lifetimes. The increase of the recombination rates significantly affects the performance of the related solar cells. Among all the chemical treatments tested to recover the lifetime of the carrier after air exposure, the KCN etching seems to be the most efficient. | Notes: | Buffiere, M (corresponding author), Imec Partner Solliance, Kapeldreef 75, B-3001 Heverlee, Belgium. | Keywords: | CZTSe;charge carrier lifetime;surface properties;thin films;solar cells | Document URI: | http://hdl.handle.net/1942/31558 | ISBN: | 978-1-4799-3299-3 | ISI #: | WOS:000340054100434 | Category: | C1 | Type: | Proceedings Paper |
| Appears in Collections: | Research publications |
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