Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/31614
Title: Large-area, catalyst-free heteroepitaxy of InAs nanowires on Si by MOVPE
Large-area, catalyst-free heteroepitaxy of InAs nanowires on Si by MOVPE
Authors: Cantoro, M.
Wang, G.
Lin, H. C.
Klekachev, A. V.
Richard, O.
Bender, H.
Kim, T. -G.
Clemente, F.
Adelmann, C.
van der Veen, M. H.
BRAMMERTZ, Guy 
Degroote, S.
Leys, M.
Caymax, M.
Heyns, M. M.
De Gendt, S.
Issue Date: 2011
Publisher: WILEY-V C H VERLAG GMBH
Source: PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 208 (1) , p. 129 -135
Abstract: In this paper, we show the results of experiments of InAs nanowire (NW) growth on (111)-oriented Si wafers. The NWs, grown at 620 degrees C by metal-organic vapor-phase epitaxy, are vertically aligned and similar to 30 nm in diameter. Their structural properties are studied by transmission electron microscopy, evidencing a polytypic character, and the vibrational properties by Raman spectroscopy. An assessment of their electrical transport properties is carried out by measuring back-gated, single InAs NW field-effect transistors. The absence of a catalyst ensures the compatibility of the NW growth process with current CMOS technology. (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Notes: Cantoro, M (corresponding author), IMEC, Kapeldreef 75, B-3001 Louvain, Belgium.
cantoro@imec.be
Keywords: III-V NANOWIRES;OPTOELECTRONIC DEVICES;SILICON NANOWIRES;EPITAXIAL-GROWTH;SCATTERING;TRANSISTORS;III-V semiconductors;electronic transport;InAs;MOVPE;nanowires;Raman spectroscopy
Document URI: http://hdl.handle.net/1942/31614
ISSN: 1862-6300
e-ISSN: 1862-6319
DOI: 10.1002/pssa.201026396
ISI #: WOS:000287295100020
Rights: 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Category: A1
Type: Journal Contribution
Appears in Collections:Research publications

Files in This Item:
File Description SizeFormat 
pssa.201026396.pdf
  Restricted Access
Published version578.27 kBAdobe PDFView/Open    Request a copy
Show full item record

SCOPUSTM   
Citations

18
checked on Oct 12, 2025

WEB OF SCIENCETM
Citations

18
checked on Oct 19, 2025

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.