Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/31674
Title: Crystallographic and optoelectronic properties of the novel thin film absorber Cu2GeS3
Authors: Robert, E. V. C.
DE WILD, Jessica 
Colombara, D.
Dale, P. J.
Issue Date: 2016
Publisher: SPIE-INT SOC OPTICAL ENGINEERING
Source: Proceedings Thin Films for Solar and Energy Technology VIII, SPIE-INT SOC OPTICAL ENGINEERING, (Art N° 993607)
Series/Report: Proceedings of SPIE
Series/Report no.: 9936
Abstract: Thin films of Cu2GeS3 are grown by annealing copper layers in GeS and S gaseous atmosphere above 460 degrees C. Below 500 degrees C the cubic polymorph is formed, having inferior optoelectronic properties compared to the monoclinic phase, formed at higher temperature. The bandgap of the cubic phase lies below that of the monoclinic phase: they are determined from absorption measurements to be 1.23 and 1.55 eV respectively. Photoluminescence measurements are performed and only the monoclinic Cu2GeS3 shows a photoluminescence signal with a peak maximum at 1.57 eV. We attribute this difference between cubic and monoclinic to the higher quasi fermi level splitting of the monoclinic phase. Wavelength dependent photoelectrochemical measurements demonstrate the Cu2GeS3 to be p-type with an apparent quantum efficiency of less than 3 % above the band gap.
Keywords: Cu2GeS3;thin film semiconductors;polymorphism;annealing;monoclinic;X-ray diffraction;absorption
Document URI: http://hdl.handle.net/1942/31674
ISBN: 978-1-5106-0264-9
DOI: 10.1117/12.2236621
ISI #: WOS:000389776300004
Category: C1
Type: Proceedings Paper
Appears in Collections:Research publications

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