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http://hdl.handle.net/1942/37164
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DC Field | Value | Language |
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dc.contributor.author | Freitas, Nahuel | - |
dc.contributor.author | PROESMANS, Karel | - |
dc.contributor.author | Esposito, Massimiliano | - |
dc.date.accessioned | 2022-04-04T12:13:16Z | - |
dc.date.available | 2022-04-04T12:13:16Z | - |
dc.date.issued | 2022 | - |
dc.date.submitted | 2022-03-31T11:03:42Z | - |
dc.identifier.citation | PHYSICAL REVIEW E, 105 (3) (Art N° 034107) | - |
dc.identifier.uri | http://hdl.handle.net/1942/37164 | - |
dc.description.abstract | We find the relation between reliability and entropy production in a realistic model of electronic memory (low power metal-oxide-semiconductor-based SRAM) where logical values are encoded as metastable nonequilibrium states. We employ large deviation techniques to obtain an analytical expression for the bistable quasipotential describing the nonequilibrium steady state and use it to derive an explicit expression bounding the error rate of the memory. Our results go beyond the dominant contribution given by classical instanton theory and provide accurate estimates of the error rate as confirmed by comparison with stochastic simulations. | - |
dc.description.sponsorship | We acknowledge funding from the European Research Council, project NanoThermo (ERC-2015- CoGAgreement No. 681456), and from the Luxembourg National Research Fund (FNR), CORE project NTEC (C19/MS/13664907). | - |
dc.language.iso | en | - |
dc.publisher | AMER PHYSICAL SOC | - |
dc.rights | 2022 American Physical Society | - |
dc.title | Reliability and entropy production in nonequilibrium electronic memories | - |
dc.type | Journal Contribution | - |
dc.identifier.issue | 3 | - |
dc.identifier.volume | 105 | - |
local.format.pages | 9 | - |
local.bibliographicCitation.jcat | A1 | - |
dc.description.notes | Freitas, N (corresponding author), Univ Luxembourg, Dept Phys & Mat Sci, Complex Syst & Stat Mech, L-1511 Luxembourg, Luxembourg. | - |
local.publisher.place | ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA | - |
local.type.refereed | Refereed | - |
local.type.specified | Article | - |
local.bibliographicCitation.artnr | 034107 | - |
dc.identifier.doi | 10.1103/PhysRevE.105.034107 | - |
dc.identifier.isi | WOS:000766300000006 | - |
local.provider.type | wosris | - |
local.description.affiliation | [Freitas, Nahuel; Proesmans, Karel; Esposito, Massimiliano] Univ Luxembourg, Dept Phys & Mat Sci, Complex Syst & Stat Mech, L-1511 Luxembourg, Luxembourg. | - |
local.description.affiliation | [Proesmans, Karel] Hasselt Univ, Theoret Phys, B-3590 Diepenbeek, Belgium. | - |
local.uhasselt.international | yes | - |
item.accessRights | Open Access | - |
item.validation | ecoom 2023 | - |
item.contributor | Freitas, Nahuel | - |
item.contributor | PROESMANS, Karel | - |
item.contributor | Esposito, Massimiliano | - |
item.fulltext | With Fulltext | - |
item.fullcitation | Freitas, Nahuel; PROESMANS, Karel & Esposito, Massimiliano (2022) Reliability and entropy production in nonequilibrium electronic memories. In: PHYSICAL REVIEW E, 105 (3) (Art N° 034107). | - |
crisitem.journal.issn | 2470-0045 | - |
crisitem.journal.eissn | 2470-0053 | - |
Appears in Collections: | Research publications |
Files in This Item:
File | Description | Size | Format | |
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Reliability_and_entropy_production_in_non_equilibrium_electronic_memories (2).pdf | Peer-reviewed author version | 884.59 kB | Adobe PDF | View/Open |
Reliability and entropy production in nonequilibrium electronic memories.pdf Restricted Access | Published version | 1.06 MB | Adobe PDF | View/Open Request a copy |
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