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http://hdl.handle.net/1942/3728| Title: | ELECTRIC-FIELD RELAXATION IN PROLONGED-TIME PHOTOCURRENT EXPERIMENTS | Authors: | SCHAUER, F BRADA, P Adriaenssens, G.J. NESLADEK, Milos STALS, Lambert |
Issue Date: | 1993 | Publisher: | ELSEVIER SCIENCE BV | Source: | JOURNAL OF NON-CRYSTALLINE SOLIDS, 166. p. 505-508 | Abstract: | The influence of the progressive electric field relaxation on the transient photocurrent for intrinsic and B-doped a-Si:H samples is investigated. The photocurrent measurements are compared with the voltage sweep-out experiments and with mathematical simulations of the photocurrent obtained from the numerical solution of the multiple trapping model. Beyond the dielectric relaxation a current due to the charge release from deep traps is identified. | Notes: | TECH ACAD BRNO,DEPT PHYS,CS-60200 BRNO,CZECH REPUBLIC.NESLADEK, M, LIMBURGS UNIV CENTRUM,INST MAT RES,DIV MAT PHYS,CAMPUSLAAN,B-3590 DIEPENBEEK,BELGIUM. | Document URI: | http://hdl.handle.net/1942/3728 | ISI #: | A1993MT01200123 | Type: | Journal Contribution |
| Appears in Collections: | Research publications |
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