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Title: | Determination of the dielectric constant of non-planar nanostructures and single nanoparticles by electrostatic force microscopy | Authors: | FUHRMANN, Marc Musyanovych, Anna THOELEN, Ronald Moebius, Hildegard |
Issue Date: | 2022 | Publisher: | IOP Publishing Ltd | Source: | Journal of physics communications, 6 (12) (Art N° 125005) | Abstract: | Electrostatic Force Microscopy has been proven to be a precise and versatile tool to perform quantitative measurements of the dielectric constant of thin film domains in the nanometer range. However, it is difficult to measure non-planar nanostructures because topographic crosstalk significantly contributes to the measured signal. This topographic crosstalk due to distance changes between tip and substrate measuring non-planar surface structures is still an ongoing issue in literature and falsifies measurements of the dielectric constant of nanostructures and nanoparticles. Tip and substrate form a capacitor based on the contact potential difference between the tip and substrate material. An increase of the distance between tip and substrate causes a repulsive force while a decrease causes an attractive force. Thus, measuring in the so-called lift mode scanning the surface in a second scan following the topography determined by a first scan leads to a mirroring of the non-planar surface structure in the electrostatic signal superimposing the signal from dielectric contrast. In this work we demonstrate that the topographic crosstalk can be avoided by using the linear mode instead of the lift mode. The use of the linear mode now allows the determination of the dielectric constant of single nanoparticles. | Notes: | Moebius, H (corresponding author), Univ Appl Sci Kaiserslautern, Dept Comp Sci Micro Syst Technol, Amerikastr 1, D-66482 Zweibrucken, Germany. hildegard.moebius@hs-kl.de |
Keywords: | atomic force microscopy;electrostatic force microscopy;polymer nanoparticles;dielectric properties | Document URI: | http://hdl.handle.net/1942/39197 | ISSN: | 2399-6528 | DOI: | 10.1088/2399-6528/aca87b | ISI #: | 000899424700001 | Rights: | 2022 The Author(s). Published by IOP Publishing Ltd. Open access Original content from this work may be used under the terms of the Creative Commons Attribution 4.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. | Category: | A1 | Type: | Journal Contribution |
Appears in Collections: | Research publications |
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