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http://hdl.handle.net/1942/4289
Title: | New approach for the measurement of residual macroscopic stresses on highly preferentially oriented thin films using X-ray diffraction | Authors: | MEERT, Bart QUAEYHAEGENS, Carl KNUYT, Gilbert JANSSEN, Herman STALS, Lambert |
Issue Date: | 1998 | Publisher: | 1997 | Source: | Proceedings of the 5th International Conference on Residual Stresses. p. 522-527. | Document URI: | http://hdl.handle.net/1942/4289 | Type: | Proceedings Paper |
Appears in Collections: | Research publications |
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