A 2D Simulation-Assisted Investigation of a Low Breakdown Voltage Module

Abstract

Upscaling perovskites modules from laboratory to market specifications requires modules to resist heat, humidity, and partial shading. When a device is partially covered or damaged, the unbalanced photocurrent generated can create an irreversible damage. Mitigation via bypass diodes can be expensive. This might not be necessary for perovskite-based modules. After an initial validation of the finite difference model for a simulation-assisted investigation, a module is systematically damaged and characterized to reproduce an unbalanced photocurrent generation. The device shows a breakdown voltage (< 1 V), which is unexpectedly much lower than for a standalone perovskite cell (approximate to 7 V). The effect is reproducible over time, and it demonstrates that in a reverse bias scenario, electricity can tunnel through the monolithic interconnection (P1P2P3) and operate similar to a low-voltage bypass diode. Eventually, the current and voltage distribution via electroluminescence is mapped to validate the 2D simulations and reproduce the device behavior at different loads.