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http://hdl.handle.net/1942/5719| Title: | Characterization of the early stages of electromigration in Al-based metal lines by means of a high resloution resistance monitoring technique based on an extremely stable ambient temperature | Authors: | DE CEUNINCK, Ward DE SCHEPPER, Luc STALS, Lambert d' Haeger, V. |
Issue Date: | 1996 | Source: | Proceedings of the Materials Research Symposium, San Diego (USA), 9-12 April 1996. p. 133-140. | Document URI: | http://hdl.handle.net/1942/5719 | Type: | Proceedings Paper |
| Appears in Collections: | Research publications |
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