Evaluation on a two days time scale of high reliability electronic assemblies by in-situ electrical and optomechanical tests techniques

Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/6236

Title:	Evaluation on a two days time scale of high reliability electronic assemblies by in-situ electrical and optomechanical tests techniques
Authors:	Gregoris, G. Bouton, F. de Keukeleire, C. Siliprandi, P. Baio, F. DE SCHEPPER, Luc DE CEUNINCK, Ward Tielemans, L. Ahrens, T. Krumm, M.
Issue Date:	1995
Source:	Proceedings 7th International Conference on Quality in Electronic Components, Failure Prevention, Detection and Analysis (ESREF) '95. p. 155-160.
Document URI:	http://hdl.handle.net/1942/6236
Type:	Proceedings Paper
Appears in Collections:	Research publications

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