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http://hdl.handle.net/1942/6236
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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Gregoris, G. | - |
dc.contributor.author | Bouton, F. | - |
dc.contributor.author | de Keukeleire, C. | - |
dc.contributor.author | Siliprandi, P. | - |
dc.contributor.author | Baio, F. | - |
dc.contributor.author | DE SCHEPPER, Luc | - |
dc.contributor.author | DE CEUNINCK, Ward | - |
dc.contributor.author | Tielemans, L. | - |
dc.contributor.author | Ahrens, T. | - |
dc.contributor.author | Krumm, M. | - |
dc.date.accessioned | 2007-12-20T16:06:14Z | - |
dc.date.available | 2007-12-20T16:06:14Z | - |
dc.date.issued | 1995 | - |
dc.identifier.citation | Proceedings 7th International Conference on Quality in Electronic Components, Failure Prevention, Detection and Analysis (ESREF) '95. p. 155-160. | - |
dc.identifier.uri | http://hdl.handle.net/1942/6236 | - |
dc.language.iso | en | - |
dc.title | Evaluation on a two days time scale of high reliability electronic assemblies by in-situ electrical and optomechanical tests techniques | - |
dc.type | Proceedings Paper | - |
local.bibliographicCitation.conferencedate | 1995 | - |
local.bibliographicCitation.conferencename | International Conference on Quality in Electronic Components, Failure Prevention, Detection and Analysis (ESREF) '95 | - |
dc.bibliographicCitation.conferencenr | 7 | - |
local.bibliographicCitation.conferenceplace | Bordeaux | - |
dc.identifier.epage | 160 | - |
dc.identifier.spage | 155 | - |
local.type.specified | Proceedings Paper | - |
dc.bibliographicCitation.oldjcat | - | |
local.bibliographicCitation.btitle | Proceedings 7th International Conference on Quality in Electronic Components, Failure Prevention, Detection and Analysis (ESREF) '95 | - |
item.fulltext | No Fulltext | - |
item.fullcitation | Gregoris, G.; Bouton, F.; de Keukeleire, C.; Siliprandi, P.; Baio, F.; DE SCHEPPER, Luc; DE CEUNINCK, Ward; Tielemans, L.; Ahrens, T. & Krumm, M. (1995) Evaluation on a two days time scale of high reliability electronic assemblies by in-situ electrical and optomechanical tests techniques. In: Proceedings 7th International Conference on Quality in Electronic Components, Failure Prevention, Detection and Analysis (ESREF) '95. p. 155-160.. | - |
item.contributor | Gregoris, G. | - |
item.contributor | Bouton, F. | - |
item.contributor | de Keukeleire, C. | - |
item.contributor | Siliprandi, P. | - |
item.contributor | Baio, F. | - |
item.contributor | DE SCHEPPER, Luc | - |
item.contributor | DE CEUNINCK, Ward | - |
item.contributor | Tielemans, L. | - |
item.contributor | Ahrens, T. | - |
item.contributor | Krumm, M. | - |
item.accessRights | Closed Access | - |
Appears in Collections: | Research publications |
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