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http://hdl.handle.net/1942/6236| Title: | Evaluation on a two days time scale of high reliability electronic assemblies by in-situ electrical and optomechanical tests techniques | Authors: | Gregoris, G. Bouton, F. de Keukeleire, C. Siliprandi, P. Baio, F. DE SCHEPPER, Luc DE CEUNINCK, Ward Tielemans, L. Ahrens, T. Krumm, M. |
Issue Date: | 1995 | Source: | Proceedings 7th International Conference on Quality in Electronic Components, Failure Prevention, Detection and Analysis (ESREF) '95. p. 155-160. | Document URI: | http://hdl.handle.net/1942/6236 | Type: | Proceedings Paper |
| Appears in Collections: | Research publications |
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