Please use this identifier to cite or link to this item:
http://hdl.handle.net/1942/6683
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Tian, C. | - |
dc.contributor.author | Gomez, J. | - |
dc.contributor.author | Beyer, G.P. | - |
dc.contributor.author | de Bisschop, P. | - |
dc.contributor.author | Vandervorst, W. | - |
dc.contributor.author | WU, Ting-Di | - |
dc.contributor.author | D'OLIESLAEGER, Marc | - |
dc.date.accessioned | 2007-12-20T16:09:44Z | - |
dc.date.available | 2007-12-20T16:09:44Z | - |
dc.date.issued | 1998 | - |
dc.identifier.citation | Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, 7-12 September 1997). p. 351-354. | - |
dc.identifier.uri | http://hdl.handle.net/1942/6683 | - |
dc.publisher | Chichester Wiley 1998 | - |
dc.title | Towards an understanding of ion beam mixing by quantitative internal profiling: Cu in Si | - |
dc.type | Proceedings Paper | - |
dc.identifier.epage | 354 | - |
dc.identifier.spage | 351 | - |
local.type.specified | Proceedings Paper | - |
dc.bibliographicCitation.oldjcat | - | |
local.bibliographicCitation.btitle | Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, 7-12 September 1997) | - |
item.fullcitation | Tian, C.; Gomez, J.; Beyer, G.P.; de Bisschop, P.; Vandervorst, W.; WU, Ting-Di & D'OLIESLAEGER, Marc (1998) Towards an understanding of ion beam mixing by quantitative internal profiling: Cu in Si. In: Proceedings of the 11th International Conference on Secondary Ion Mass Spectrometry (SIMS 11, Orlando, Fla, 7-12 September 1997). p. 351-354.. | - |
item.fulltext | No Fulltext | - |
item.contributor | Tian, C. | - |
item.contributor | Gomez, J. | - |
item.contributor | Beyer, G.P. | - |
item.contributor | de Bisschop, P. | - |
item.contributor | Vandervorst, W. | - |
item.contributor | WU, Ting-Di | - |
item.contributor | D'OLIESLAEGER, Marc | - |
item.accessRights | Closed Access | - |
Appears in Collections: | Research publications |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.