Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/7288
Title: Two lack of fit tests for multiple logistic regression
Authors: AERTS, Marc 
CLAESKENS, Gerda 
HART, Jeffrey 
MOONS, Elke 
WETS, Geert 
Issue Date: 2003
Publisher: Leuven : KUL
Source: Verbeke, G. & Molenberghs, G. & Aerts, M. & Fieuws, S. (Ed.) Proceedings of the 18th International Workshop on Statistical Modelling. p. 15-20.
Abstract: Several methods have been developed to assess the fit of a regression model. Many lack of fit tests however focus on the simple regression setting. Here we propose two tests which are completely different in nature, but which both are promising especially in the case of a multiple regression model with several potential explanatory variables.
Keywords: Bayes information criterion; classification trees; lack of fit; posterior distribution; recursive partitioning
Document URI: http://hdl.handle.net/1942/7288
Category: C2
Type: Proceedings Paper
Appears in Collections:Research publications

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