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http://hdl.handle.net/1942/8143| Title: | Electrical characterisation and reliability studies of thick film gas sensor structures. | Authors: | CZECH, Jan MANCA, Jean Roggen J Huyberechts G STALS, Lambert DE SCHEPPER, Luc |
Issue Date: | 1996 | Publisher: | I E E E | Source: | ICMTS 1996 - 1996 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, PROCEEDINGS. p. 99-103. | Notes: | LIMBURGS UNIV CENTRUM, INST MAT RES, DIV MAT PHYS, DIEPENBEEK, B-3590 BELGIUM. | Document URI: | http://hdl.handle.net/1942/8143 | ISBN: | 0-7803-2783-7 | ISI #: | A1996BG12J00018 | Type: | Proceedings Paper |
| Appears in Collections: | Research publications |
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