Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/8143
Title: Electrical characterisation and reliability studies of thick film gas sensor structures.
Authors: CZECH, Jan 
MANCA, Jean 
Roggen J
Huyberechts G
STALS, Lambert 
DE SCHEPPER, Luc 
Issue Date: 1996
Publisher: I E E E
Source: ICMTS 1996 - 1996 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, PROCEEDINGS. p. 99-103.
Notes: LIMBURGS UNIV CENTRUM, INST MAT RES, DIV MAT PHYS, DIEPENBEEK, B-3590 BELGIUM.
Document URI: http://hdl.handle.net/1942/8143
ISBN: 0-7803-2783-7
ISI #: A1996BG12J00018
Type: Proceedings Paper
Appears in Collections:Research publications

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