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http://hdl.handle.net/1942/8569
Title: | Optical properties of heavily boron-doped nanocrystalline diamond films studied by spectroscopic ellipsometry | Authors: | Zimmer, A. WILLIAMS, Oliver HAENEN, Ken Terryn, H. |
Issue Date: | 2008 | Publisher: | AMER INST PHYSICS | Source: | APPLIED PHYSICS LETTERS, 93(13) | Abstract: | The optical properties of heavily boron-doped nanocrystalline diamond films grown by microwave plasma enhanced chemical vapor deposition on silicon substrates are presented. The diamond films are characterized by spectroscopic ellipsometry within the midinfrared, visible, and near-ultraviolet regions. The ellipsometric spectra are also found to be best described by a four-phase model yielding access to the optical constants, which are found distinct from previous nanocrystalline diamond literature values. The presence of a subgap absorption yielding high extinction coefficient values defined clearly the boron incorporated films in comparison to both undoped and composite films, while refractive index values are relatively comparable. (C) 2008 American Institute of Physics. | Notes: | [Zimmer, A.; Terryn, H.] Vrije Univ Brussels, Res Grp Met Electrochem & Mat Sci, B-1050 Brussels, Belgium. [Williams, O. A.; Haenen, K.] Univ Hasselt, Inst Mat Res IMO, B-3590 Diepenbeek, Belgium. [Williams, O. A.; Haenen, K.] IMEC VZW, Div IMOMEC, B-3590 Diepenbeek, Belgium. | Document URI: | http://hdl.handle.net/1942/8569 | ISSN: | 0003-6951 | e-ISSN: | 1077-3118 | DOI: | 10.1063/1.2990679 | ISI #: | 000259794100030 | Category: | A1 | Type: | Journal Contribution | Validations: | ecoom 2009 |
Appears in Collections: | Research publications |
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File | Description | Size | Format | |
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Zimmer.pdf | Non Peer-reviewed author version | 754.03 kB | Adobe PDF | View/Open |
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