STALS, Lambert

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Full Name
STALS, Lambert
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lambert.stals@uhasselt.be
 
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Date Issued:  1996

Results 1-20 of 24 (Search time: 0.004 seconds).

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Issue DateTitleContributor(s)TypeCat.
11996Electrical characterisation and reliability studies of thick film gas sensor structures.CZECH, Jan; MANCA, Jean; Roggen J; Huyberechts G; STALS, Lambert; DE SCHEPPER, LucProceedings Paper
21996A new technique to characterize the early stages of electromigration-induced resistance changes at low current densitiesDHaeger, V; DE CEUNINCK, Ward; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
31996Study of nitrogen-implanted stainless steels by CEMS and TEMBriglia, T; Terwagne, G; Bodart, F; QUAEYHAEGENS, Carl; D'HAEN, Jan; STALS, LambertJournal Contribution
41996A diffusion model of metal surface modification during plasma nitridingDimitrov, VI; D'HAEN, Jan; KNUYT, Gilbert; QUAEYHAEGENS, Carl; STALS, LambertJournal Contribution
51996A model for thin film texture evolution driven by surface energy effectsKNUYT, Gilbert; QUAEYHAEGENS, Carl; D'HAEN, Jan; STALS, LambertJournal Contribution
61996Promising developments for new applicationsQUAEYHAEGENS, Carl; Kerkhofs, M; STALS, Lambert; Van Stappen, MJournal Contribution
71996Residual macroscopic stress in highly preferentially oriented titanium nitride coatings deposited on various steel typesQUAEYHAEGENS, Carl; KNUYT, Gilbert; STALS, LambertJournal Contribution
81996Characterization of the early stages of electromigration in Al-based metal lines by means of a high resloution resistance monitoring technique based on an extremely stable ambient temperatureDE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, Lambert; d' Haeger, V.Proceedings Paper
91996State of the art of the combined surface treatment: plasma nitriding and hard wear resistant coatingsQUAEYHAEGENS, Carl; D' HAEN, Jan; STALS, LambertJournal Contribution
101996A re-interpretation of the existence of a spectrum of activation energies for the microstructural changes in Al 1% Si linesStulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
111996Nieuwe toepassingen voor harde, slijtvaste deklagenQUAEYHAEGENS, Carl; STALS, Lambert; KERKHOFS, M.; van Stappen, M.Journal Contribution
121996State of the art for the industrial use of ceramic PVD coatingsSTALS, Lambert; KERKHOFS, M.; QUAEYHAEGENS, Carl; van Stappen, M.Journal Contribution
131996On the deposition and characterization of thin SnO2 filmsCZECH, I.; DE SCHEPPER, Luc; STALS, Lambert; Roggen, J.; Huyberechts, G.Proceedings Paper
141996Evidence for the principal defect states in CVD diamond films: Optical studyVanecek, M; Rosa, J; NESLADEK, Milos; STALS, LambertJournal Contribution
151996Optical absorption and cathodoluminescence in homoepitaxially grown CVD diamond filmsMEYKENS, Kristien; NESLADEK, Milos; QUAEYHAEGENS, Carl; STALS, Lambert; Vanecek, M; Rosa, J; Janssen, G; Schermer, JJJournal Contribution
161996Origin of characteristic subgap optical absorption in CVD diamond filmsNESLADEK, Milos; MEYKENS, Kristien; STALS, Lambert; Vanecek, M; Rosa, JJournal Contribution
171996Characteristic subgap optical absorption in CVD diamond films due to amorphous carbon inclusionsNESLADEK, Milos; MEYKENS, Kristien; QUAEYHAEGENS, Carl; STALS, LambertJournal Contribution
181996Defect-induced optical absorption in CVD diamond filmsNESLADEK, Milos; Vanecek, M; STALS, LambertJournal Contribution
191996Optical emission spectroscopy of the plasma during CVD diamond growth with nitrogen additionVandevelde, Thierry; NESLADEK, Milos; QUAEYHAEGENS, Carl; STALS, LambertJournal Contribution
201996Imaging of the ageing on organic electroluminescent diodes, under different atmospheres by impedance spectroscopy, scanning electron microscopy and SIMS depth profiling analysisBijnens, W; MANCA, Jean; WU, Ting-Di; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; GELAN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
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