LEKENS, Geert

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LEKENS, Geert

geert.lekens@uhasselt.be

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Date Issued: [2000 TO 2009]

Author: DE CEUNINCK, Ward

Results 1-4 of 4 (Search time: 0.002 seconds).

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	Issue Date	Title	Contributor(s)	Type	Cat.
1	2007	Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperature	MOONEN, Rob; Vanmeerbeek, P; LEKENS, Geert; DE CEUNINCK, Ward; Moens, P.; Boutsen, J.	Proceedings Paper	C1
2	2007	Lifetime modeling of intrinsic gate oxide breakdown at high temperature	MOONEN, Rob; Vanmeerbeek, P; LEKENS, Geert; DE CEUNINCK, Ward; Moens, P.; BOUTSEN, Jan	Journal Contribution	A1
3	2003	Advantage of in-situ to ex-situ techniques as reliability tool: aging kinetcs of Imec's MCM-D discrete passive devices	Soussan, P.; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward; Beyne, E.	Proceedings Paper	C2
4	2003	Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices.	Soussan, P; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward; Beyne, E	Journal Contribution	A1