LEKENS, Geert

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LEKENS, Geert

geert.lekens@uhasselt.be

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Type: Journal Contribution

Date Issued: [2000 TO 2009]

Results 1-3 of 3 (Search time: 0.002 seconds).

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	Issue Date	Title	Contributor(s)	Type	Cat.
1	2007	Lifetime modeling of intrinsic gate oxide breakdown at high temperature	MOONEN, Rob; Vanmeerbeek, P; LEKENS, Geert; DE CEUNINCK, Ward; Moens, P.; BOUTSEN, Jan	Journal Contribution	A1
2	2005	Failure mechanisms and qualification testing of passive components	Post, H.A.; Letullier, P.; Briolat, T.; Humke, R.; Schuhmann, R.; Saarinen, K.; Werner, W.; Ousten, Y.; LEKENS, Geert; Dehbi, A.; Wondrak, W.	Journal Contribution	A1
3	2003	Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices.	Soussan, P; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward; Beyne, E	Journal Contribution	A1