CROES, Kristof

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CROES, Kristof

kristof.croes@uhasselt.be

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Internal UHasselt: MANCA, Jean

Date Issued: 2001

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		Issue Date	Title	Contributor(s)	Type	Cat.
	1	2001	A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation	DREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, G	Journal Contribution	A1
	2	2001	High-resolution in-situ study of gold electromigration: test time reduction	CROES, Kristof; DREESEN, Raf; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Van der Wel, P	Journal Contribution	A1