CROES, Kristof

Full Name
CROES, Kristof
Email
kristof.croes@uhasselt.be
 
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Publications

Results 1-18 of 18 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)TypeCat.
12015Endocrine actions of pesticides measured in the Flemish environment and health studies (FLEHS I and II)CROES, Kristof ; Den Hond, E.; BRUCKERS, Liesbeth ; Govarts, E.; Schoeters, G.; Covaci, A.; Loots, I.; Morrens, B.; Nelen, V.; Sioen, I.; Van Larebeke, N.; Baeyens, W.Journal ContributionA1
22013Neurobehavioral Function and low-level Exposure to Brominated Flame Retardants in Adolescents: a cross-sectional StudyKICINSKI, Michal ; Viaene, M.; Den Hond, E.; Schoeters, G.; Covaci, A.; Dirtu, A.; Nelen, V.; BRUCKERS, Liesbeth ; CROES, Kristof ; Van Larebeke, N.; NAWROT, Tim Conference MaterialC2
32013Determination of PCDD/Fs, PBDD/Fs and dioxin-like PCBs in human milk from mothers residing in the rural areas in Flanders, using the CALUX bioassay and GC-HRMSCROES, Kristof ; Colles, A.; Koppen, G.; De Galan, S.; Vandermarken, T.; Govarts, E.; BRUCKERS, Liesbeth ; Nelen, V.; Schoeters, G.; Van Larebeke, N.; Denison, M. S.; Mampaey, M.; Baeyens, W.Journal ContributionA1
42008Variability of polymorphic families of three types of xylanase inhibitors in the wheat grain proteomeCourtin, CM; CROES, Kristof ; Gebruers, K.; ROBBEN, Johan ; NOBEN, Jean-Paul ; Samyn, B.; Debyser, G.; Van Beeumen, J.; Delcour, CMJournal ContributionA1
52003Moisture induced failures in flip chip on flex interconnections using anisotropic conductive adhesivesLEKENS, Geert ; DREESEN, Raf ; CROES, Kristof ; Caers, J.F.J.M.; Zhao, X.J.; Wong, E.H.Proceedings PaperC2
62002High-resolution SILC measurements of thin SiO2 ultra low voltagesARESU, Stefano ; DE CEUNINCK, Ward ; DREESEN, Raf ; CROES, Kristof ; ANDRIES, Ellen ; MANCA, Jean ; DE SCHEPPER, Luc ; DEGRAEVE, Maria ; Kaczer, B.; D'OLIESLAEGER, Marc ; D'HAEN, Jan Journal ContributionA1
72002Statistical aspects of the degradation of LDD nMOSFETsANDRIES, Ellen ; DREESEN, Raf ; CROES, Kristof ; DE CEUNINCK, Ward ; DE SCHEPPER, Luc ; Groeseneken, G; Lo, KF; D'OLIESLAEGER, Marc ; D'HAEN, Jan Journal ContributionA1
82001High-resolution in-situ study of gold electromigration: test time reductionCROES, Kristof ; DREESEN, Raf ; MANCA, Jean ; DE CEUNINCK, Ward ; DE SCHEPPER, Luc ; Tielemans, L; Van der Wel, PJournal ContributionA1
92001A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradationDREESEN, Raf ; CROES, Kristof ; MANCA, Jean ; DE CEUNINCK, Ward ; DE SCHEPPER, Luc ; Pergoot, A; Groeseneken, GJournal ContributionA1
102000Reliability aspects of high temperature power MOSFETsMANCA, Jean ; Wondrak, W; Schaper, W; CROES, Kristof ; D'HAEN, Jan ; DE CEUNINCK, Ward ; Dieval, B; Hartnagel, HL; D'OLIESLAEGER, Marc ; DE SCHEPPER, Luc Journal ContributionA1
111999Modelling hot-carrier degradation of LDD NMOSFETs by using a high-resolution measurement technique.DREESEN, Raf ; CROES, Kristof ; MANCA, Jean ; DE CEUNINCK, Ward ; DE SCHEPPER, Luc ; Pergoot, A; Groeseneken, GJournal Contribution
121999Investigation of the formation of M-2(+)-molecular ions in sputtering processesVLEKKEN, Johan ; CROES, Kristof ; WU, Ting-Di; D'OLIESLAEGER, Marc ; KNUYT, Gilbert ; Vandervorst, W; DE SCHEPPER, Luc Journal Contribution
131999Statistical techniques for planning type I singly censored reliability experiments with two stress factorsCROES, Kristof Theses and DissertationsT1
141998Bimodal failure behaviour of metal film resistorsCROES, Kristof ; DE CEUNINCK, Ward ; DE SCHEPPER, Luc ; Tielemans, LJournal Contribution
151998Localized monitoring of electromigration with early resistance change measurementsMANCA, Jean ; CROES, Kristof ; DE CEUNINCK, Ward ; D'Haeger, V; D'HAEN, Jan ; Depauw, P; Tielemans, L; DE SCHEPPER, Luc Journal Contribution
161998Electrical characterization and reliability evaluation of capacitors by means of in situ leakage current measurementsMANCA, Jean ; CROES, Kristof ; DE SCHEPPER, Luc ; DE CEUNINCK, Ward ; STALS, Lambert ; Jacques, L; Tielemans, L; Gerrits, N; Hoppener, RJournal Contribution
171998Investigation of correlations between parameters defining the state of sputtered particlesVLEKKEN, Johan ; CROES, Kristof ; D'OLIESLAEGER, Marc ; KNUYT, Gilbert ; Vandervorst, W.; DE SCHEPPER, Luc Proceedings Paper
181998The time of 'guessing' your failure time distribution is over!CROES, Kristof ; MANCA, Jean ; DE CEUNINCK, Ward ; DE SCHEPPER, Luc ; MOLENBERGHS, Geert Journal Contribution