Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/3195
Title: Electrical characterization and reliability evaluation of capacitors by means of in situ leakage current measurements
Authors: MANCA, Jean 
CROES, Kristof 
DE SCHEPPER, Luc 
DE CEUNINCK, Ward 
STALS, Lambert 
Jacques, L
Tielemans, L
Gerrits, N
Hoppener, R
Issue Date: 1998
Publisher: JOHN WILEY & SONS LTD
Source: QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 14(2). p. 63-68
Abstract: The in situ leakage current measurement technique is presented for the high-resolution observation of the electrical behaviour of dielectric material systems, e.g. capacitors, at high temperatures. This technique is useful for the electrical characterization of dielectrics during linear heating experiments and/or isothermal steps, Applied to a population of test structures, the in situ leakage current measurement technique is a rapid and powerful tool to assess the reliability and quality of dielectric components and assemblies. Results obtained on populations of film capacitors and ceramic capacitors are presented. (C) 1998 John Wiley & Sons, Ltd.
Notes: Limburgs Univ Ctr, Inst Mat Res, Div Mat Phys, B-3590 Diepenbeek, Belgium. Philips Components Ind, B-8800 Roeselare, Belgium. DESTIN NV, B-3590 Diepenbeek, Belgium. DSM Solutech, NL-6422 PN Heerlen, Netherlands.Manca, JV, Limburgs Univ Ctr, Inst Mat Res, Div Mat Phys, Wetenschapspk 1, B-3590 Diepenbeek, Belgium.
Keywords: capacitors; reliability; leakage current; in situ electrical measurement technique; statistical reliability analysis
Document URI: http://hdl.handle.net/1942/3195
DOI: 10.1002/(SICI)1099-1638(199803/04)14:2<63::AID-QRE160>3.0.CO;2-P
ISI #: 000073717800002
Type: Journal Contribution
Validations: ecoom 1999
Appears in Collections:Research publications

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