DREESEN, Raf

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DREESEN, Raf

raf.dreesen@uhasselt.be

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Author: DE CEUNINCK, Ward

Type: Proceedings Paper

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		Issue Date	Title	Contributor(s)	Type	Cat.
	1	2003	Advantage of in-situ to ex-situ techniques as reliability tool: aging kinetcs of Imec's MCM-D discrete passive devices	Soussan, P.; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward; Beyne, E.	Proceedings Paper	C2
	2	1997	A high resolution method for measuring hot carrier degradation in matched transistor pairs	DREESEN, Raf; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G.	Proceedings Paper