DREESEN, Raf

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Full Name
DREESEN, Raf
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raf.dreesen@uhasselt.be
 
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Author:  Groeseneken, G

Results 1-3 of 3 (Search time: 0.001 seconds).

Issue DateTitleContributor(s)TypeCat.
12002Statistical aspects of the degradation of LDD nMOSFETsANDRIES, Ellen; DREESEN, Raf; CROES, Kristof; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G; Lo, KF; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
22001A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradationDREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, GJournal ContributionA1
31999Modelling hot-carrier degradation of LDD NMOSFETs by using a high-resolution measurement technique.DREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, GJournal Contribution