MEURIS, Marc

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MEURIS, Marc
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marc.meuris@uhasselt.be
 
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Publications

Results 141-154 of 154 (Search time: 0.004 seconds).

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Issue DateTitleContributor(s)TypeCat.
1412008Capacitance-voltage characterization of GaAs–Al2O3 interfacesBRAMMERTZ, Guy; Lin, H. -C.; Martens, K.; Mercier, D.; Sioncke, S.; Delabie, A.; Wang, W. E.; Caymax, M.; MEURIS, Marc; Heyns, M.Journal ContributionA1
1422008Structure and interface bonding of GeO2∕Ge∕In0.15Ga0.85As heterostructuresMolle, Alessandro; Spiga, Sabina; Andreozzi, Andrea; Fanciulli, Marco; BRAMMERTZ, Guy; MEURIS, MarcJournal ContributionA1
1432008GaAs on Ge for CMOSBRAMMERTZ, Guy; Caymax, M.; MEURIS, Marc; Heyns, M.; Mols, Y.; Degroote, S.; Leys, M.Journal ContributionA1
1442008On the Correct Extraction of Interface Trap Density of MOS Devices With High-Mobility Semiconductor SubstratesMartens, Koen; Chui, Chi On; BRAMMERTZ, Guy; De Jaeger, Brice; Kuzum, Duygu; MEURIS, Marc; Heyns, Marc M.; Krishnamohan, Tejas; Saraswat, Krishna; MAES, Herman; Groeseneken, GuidoJournal ContributionA1
1452008Capacitance–Voltage Characterization of GaAs–Oxide InterfacesBRAMMERTZ, Guy; Lin, H. C.; Martens, K.; Mercier, D.; Merckling, C.; Penaud, J.; Adelmann, C.; Sioncke, S.; Wang, W. E.; Caymax, M.; MEURIS, Marc; Heyns, M.Journal ContributionA1
1462008Accurate carrier profiling of n-type GaAs junctionsClarysse, T.; BRAMMERTZ, Guy; Vanhaeren, D.; Eyben, P.; Goossens, J.; Clemente, F.; MEURIS, Marc; Vandervorst, W.; Srnanek, R.; Kinder, R.; Li, Zhiqiang; Sciana, B.; Radziewicz, D.Journal ContributionA1
1472007Characteristic trapping lifetime and capacitance-voltage measurements of GaAs metal-oxide-semiconductor structuresBRAMMERTZ, Guy; Martens, Koen; Sioncke, Sonja; Delabie, Annelies; Caymax, Matty; MEURIS, Marc; Heyns, MarcJournal ContributionA1
1482007H2S exposure of a (100)Ge surface: Evidences for a (2x1) electrically passivated surfaceHoussa, M.; NELIS, Daniel; Hellin, D.; Pourtois, G.; Conard, T.; Paredis, K.; Vanormelingen, K.; Vantomme, A.; VAN BAEL, Marlies; MULLENS, Jules; Caymax, M.; MEURIS, Marc; Heyns, M. M.Journal ContributionA1
1492007Surface recombination velocity in GaAs and In0.15Ga0.85As thin filmsBRAMMERTZ, Guy; Heyns, Marc; MEURIS, Marc; Caymax, Matty; Jiang, Dehuai; Mols, Yves; Degroote, Stefan; Leys, Maarten; Borghs, GustaafJournal ContributionA1
102007Comparing GaAs and In0.15Ga0.85As as channel material for alternative substrate CMOSBRAMMERTZ, Guy; Heyns, M.; MEURIS, Marc; Caymax, M.; Jiang, D.Journal ContributionA1
112006Key Issues for the Development of a Ge CMOS Device in an Advanced IC CircuitMEURIS, Marc; Martens, K.; De Jaegar, B.; Van Steenbergen, J.; Bonzom, Renaud; Caymax, Matty R.; Houssa, M.; Kaczer, Ben; Leys, Frederik; NELIS, Daniel; Opsomer, Karl; Pourghaderi, A. M.; Satta, A.; Simoen, Eddy R.; Terzieva, Valentina; Souriau, Laurent; Bellenger, F.; BRAMMERTZ, Guy; Nicholas, G.; Scarozza, M.; Huyghebaert, C.; Winderickx, Gillis; Loo, Roger; Clarysse, Trudo; Conard, Thierry; Bender, Hugo; Benedetti, Alessandro; Todi, R.; Delabie, A.; Hellin, David; Van Daele, Benny; Sioncke, Sonja; Mertens, Paul W.; De Meyer, Krtistien; Van Elshocht, Sven; Vandervorst, Wilfried; Zimmerman, Paul; Brunco, David P.; Heyns, Marc M.Proceedings PaperC1
122006How Trace Analytical Techniques Contribute to the Research and Development of Ge and III/V Semiconductor DevicesHellin, David; Rip, Jens; Bonzom, Renaud; NELIS, Daniel; Sioncke, Sonja; BRAMMERTZ, Guy; Caymax, Matty R.; MEURIS, Marc; De Gendt, S.; Vinckier, ChrisProceedings PaperC1
132006Alternative gate dielectric materialsVan Elshocht, S.; HARDY, An; De Gendt, S.; Adelmann, D.; Brunco, D.; Caymax, M.; Conard, T.; Delugas, P.; Lehnen, P.; Shamiryan, D.; Vos, R.; Witters, P.; Zimmerman, P.; MEURIS, Marc; Heyns, M.Proceedings PaperC2
142006Selective Epitaxial Growth of GaAs on Ge Substrates with a SiO2 PatternBRAMMERTZ, Guy; Caymax, Matty R.; Mols, Yves; Degroote, Stefan; Leys, Maarten; Van Steenbergen, Jan; Winderickx, Gilles; Borghs, Gustaaf; MEURIS, MarcProceedings PaperC1
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