Potential-induced degradation (PID); A test campaign at module level

Abstract

Potential-induced degradation (PID) of photovoltaic (PV) modules may occur when high potential differences between the solar cell and the grounded frame are present. According to Naumann et al., the induced electrical field causes a leakage current and sodium ion (Na+) diffusion into stacking faults through the PN-junction of the solar cell, resulting in a substantial lowering of the shunt resistance.