Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/30038
Title: Combined TOF-SIMS/SPM characterization of cable bacteria – living electrical bacteria for next generation bioelectronics?
Authors: THIRUVALLUR EACHAMBADI, Ragha 
Boschker, Henricus T. S.
Spampinato, Valentina
Franquet, Alexis
Hidalgo-Martinez, Silvia
VALCKE, Roland 
Meysman, Filip J.R.
MANCA, Jean 
Issue Date: 2019
Source: 22nd International Conference on Secondary Ion Mass Spectrometry – SIMS-22, Kyoto, Japan, 20-25 October 2019
Document URI: http://hdl.handle.net/1942/30038
Category: C2
Type: Conference Material
Appears in Collections:Research publications

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