Please use this identifier to cite or link to this item:
http://hdl.handle.net/1942/31088| Title: | Optimizing a thermal based sensor setup for monitoring physical changes of thin films over time using numerical modeling (NanotechCrossingBorders_poster 2019) | Authors: | OUDEBROUCKX, Gilles VANDENRYT, Thijs WAGNER, Patrick THOELEN, Ronald |
Issue Date: | 2019 | Source: | Nanotechnology crossing borders, Uhasselt University - Hasselt (Limburg), Belgium, 26/09/2019-26/09/2019 | Document URI: | http://hdl.handle.net/1942/31088 | Category: | C2 | Type: | Conference Material |
| Appears in Collections: | Research publications |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| NanotechCrossingBorders_poster_GillesO_2019.pdf Restricted Access | Conference material | 494.95 kB | Adobe PDF | View/Open Request a copy |
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