Please use this identifier to cite or link to this item:
http://hdl.handle.net/1942/31090| Title: | Thermal sensor for monitoring physical changes of thin films over time | Authors: | OUDEBROUCKX, Gilles THOELEN, Ronald |
Advisors: | Thoelen, Ronald | Issue Date: | 2019 | Source: | Meeting Point Functional Layers - 1st MPFL Research Symposium, University of Lisbon -Lisbon, Portugal, 05/09/2019-06/09/2019 | Document URI: | http://hdl.handle.net/1942/31090 | Category: | C2 | Type: | Conference Material |
| Appears in Collections: | Research publications |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 20190905lisboa_MPFL_gillesOudebrouckx.pptx Restricted Access | Conference material | 17.93 MB | Microsoft Powerpoint XML | View/Open Request a copy |
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