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Title: | Electrostatic force microscopy mapping of electrical conductivity of hydrogen-terminated diamond films | Authors: | Volodin, A. Toma, C. BOGDAN, Anna DEFERME, Wim HAENEN, Ken NESLADEK, Milos Van Haesendonck, C. |
Issue Date: | 2007 | Publisher: | AMER INST PHYSICS | Source: | APPLIED PHYSICS LETTERS, 91(14). p. 142111-... | Abstract: | A method for mapping the surface conductivity of hydrogen-terminated (H-terminated) diamond on a sub-100 nm scale is presented. The measuring technique relies on electrostatic force microscopy imaging of the voltage distribution of a current-carrying H-terminated diamond film. The uniform linear voltage drop in highly conductive H-terminated diamond surface layers indicates that the layers behave as homogeneous, diffusive conductors with a well-defined value of the sheet resistance. On the other hand, we observe conductive as well as insulating regions that coexist for not perfectly H-terminated diamond surfaces with poor electric conductivity. () 2007 American Institute of Physics. (C) 2007 American Institute of Physics. | Notes: | Katholieke Univ Leuven, Lab Solid State Phys & Magnetism, BE-3001 Louvain, Belgium. Hasselt Univ, Mat Res Inst, BE-3590 Diepenbeek, Belgium. IMEC vzw, Div IMOMEC, BE-3590 Diepenbeek, Belgium.Volodin, A, Katholieke Univ Leuven, Lab Solid State Phys & Magnetism, Celestijnenlaan 200 D, BE-3001 Louvain, Belgium.alexander.volodin@fys.kuleuven.be | Document URI: | http://hdl.handle.net/1942/4148 | ISSN: | 0003-6951 | e-ISSN: | 1077-3118 | DOI: | 10.1063/1.2795342 | ISI #: | 000249974100057 | Category: | A1 | Type: | Journal Contribution | Validations: | ecoom 2008 |
Appears in Collections: | Research publications |
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