Please use this identifier to cite or link to this item: http://hdl.handle.net/1942/4169
Title: pH sensitivity of nanocrystalline diamond films
Authors: CHRISTIAENS, Pieter 
Abouzar, Maryam H.
Poghossian, A.
Wagner, T.
BIJNENS, Nathalie 
WILLIAMS, Oliver 
DAENEN, Michael 
HAENEN, Ken 
DOUHERET, Olivier 
D'HAEN, Jan 
Mekhalif, Z.
Schoening, M. J.
WAGNER, Patrick 
Issue Date: 2007
Publisher: WILEY-V C H VERLAG GMBH
Source: PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 204(9). p. 2925-2930
Abstract: The pH-sensitive properties of hydrogen- and oxygen-terminated nanocrystalline diamond (NCD) films have been investigated using a field-effect-based capacitive electrolyte-diamond-insulator-semiconductor (EDIS) structure as transducer. The NCD thin films (100-500 nm) were grown on p-Si-SiO2 Substrates by microwave plasma-enhanced chemical vapour deposition. The electrochemical characterisation of EDIS sensors with NCD films of different thicknesses has been performed in buffer solutions of pH 3 to pH 11 by means of capacitance-voltage and constant-capacitance methods. The developed EDIS sensors with O-terminated NCD surfaces show an average pH-sensitivity of 38 mV/pH A slightly smaller pH-sensitivity of 29-36 mV/pH was observed for the EDIS structure with H-terminated NCD surfaces. (C) 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Notes: Hasselt Univ, Mat Res Inst, B-3590 Diepenbeek, Belgium. IMEC vzw, Div IMOMEC, B-3590 Diepenbeek, Belgium. Aachen Univ Appl Sci, Inat Nao & Biotechnol IBN 2, D-52428 Julich, Germany. Res Ctr Julich GmbH, Inst Bio & Nanosyst, D-52425 Julich, Germany. Fac Univ Notre Dame Paix, Lab Chem & Electrochem Surfaces, B-5000 Namur, Belgium.WAGNER, P, Hasselt Univ, Mat Res Inst, Wetenschapspk 1, B-3590 Diepenbeek, Belgium.Patrick.WAGNER@uhasselt.be
Document URI: http://hdl.handle.net/1942/4169
ISSN: 0031-8965
e-ISSN: 1862-6319
DOI: 10.1002/pssa.200776326
ISI #: 000249648700015
Category: A1
Type: Journal Contribution
Validations: ecoom 2008
Appears in Collections:Research publications

Show full item record

SCOPUSTM   
Citations

8
checked on Sep 2, 2020

WEB OF SCIENCETM
Citations

12
checked on Apr 14, 2024

Page view(s)

86
checked on Nov 7, 2023

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.