Please use this identifier to cite or link to this item:
http://hdl.handle.net/1942/8544
Title: | Characterization of boron doped diamond epilayers grown in a NIRIM type reactor | Authors: | MORTET, Vincent DAENEN, Michael Teraji, T. LAZEA, Andrada Vorlicek, V. D'HAEN, Jan HAENEN, Ken D'OLIESLAEGER, Marc |
Issue Date: | 2008 | Publisher: | ELSEVIER SCIENCE SA | Source: | DIAMOND AND RELATED MATERIALS, 17(7-10). p. 1330-1334 | Abstract: | Boron doped diamond layers have been grown on (100) single crystal substrates in a wide range of boron concentration. The boron doped layers have been electrically and optically characterized. Boron doped layers with Hall mobility closes to natural diamond holes mobility have been obtained. The films morphology has been observed by scanning electron microscopy and their purity has been assessed by cathodoluminescence. Fourier Transform Photocurrent spectroscopy results show the evolution of the photo-ionization onset and the excited states as boron concentration in the films increases. (C) 2008 Elsevier B.V. All rights reserved. | Notes: | [Mortet, V.; Daenen, M.; Lazea, A.; D'Haen, J.; Haenen, K.; D'Olieslaeger, M.] Hasselt Univ, Inst Mat Res IMO, B-3590 Diepenbeek, Belgium. [Mortet, V.; Lazea, A.; D'Haen, J.; Haenen, K.; D'Olieslaeger, M.] IMEC VZW, Div IMOMEC, B-3590 Diepenbeek, Belgium. [Teraji, T.] Natl Inst Mat Sci, Tsukuba, Ibaraki 3050044, Japan. [Vorlicek, V.] Acad Sci Czech Republic, Inst Phys, CZ-18221 Prague 8, Czech Republic. | Keywords: | CVD diamond; homoepitaxy; p-type doping; electrical properties; optical properties | Document URI: | http://hdl.handle.net/1942/8544 | ISSN: | 0925-9635 | e-ISSN: | 1879-0062 | DOI: | 10.1016/j.diamond.2008.01.087 | ISI #: | 000259598300059 | Category: | A1 | Type: | Journal Contribution | Validations: | ecoom 2009 |
Appears in Collections: | Research publications |
Show full item record
SCOPUSTM
Citations
35
checked on Sep 3, 2020
WEB OF SCIENCETM
Citations
47
checked on Oct 12, 2024
Page view(s)
124
checked on Jul 28, 2023
Google ScholarTM
Check
Altmetric
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.