DE CEUNINCK, Ward

Email Alert RSS Feed

Profile

Full Name

DE CEUNINCK, Ward

Email

ward.deceuninck@uhasselt.be

Loading... 5 0 5 0 false

Loading... 6 0 5 0 false

Publications

@UHasselt

All

Author

Date issued

Internal UHasselt

Refined By:

Type: Proceedings Paper

Results 21-24 of 24 (Search time: 0.003 seconds).

1
2

Bibtex Excel CSV FWO

		Issue Date	Title	Contributor(s)	Type	Cat.
	21	1997	A high resolution method for measuring hot carrier degradation in matched transistor pairs	DREESEN, Raf; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Groeseneken, G.	Proceedings Paper
	22	1996	Characterization of the early stages of electromigration in Al-based metal lines by means of a high resloution resistance monitoring technique based on an extremely stable ambient temperature	DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, Lambert; d' Haeger, V.	Proceedings Paper
	23	1995	Evaluation on a two days time scale of high reliability electronic assemblies by in-situ electrical and optomechanical tests techniques	Gregoris, G.; Bouton, F.; de Keukeleire, C.; Siliprandi, P.; Baio, F.; DE SCHEPPER, Luc; DE CEUNINCK, Ward; Tielemans, L.; Ahrens, T.; Krumm, M.	Proceedings Paper
	24	1994	Reliability study of on-chip interconnects - prediction of electromigration resistance on a short-time scale	DE CEUNINCK, Ward; D'Haeger, V; Stulens, Herwig; DE SCHEPPER, Luc; STALS, Lambert	Proceedings Paper

1
2