BRAMMERTZ, Guy

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BRAMMERTZ, Guy
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guy.brammertz@uhasselt.be
 
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Publications

Results 101-120 of 200 (Search time: 0.006 seconds).

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Issue DateTitleContributor(s)TypeCat.
1012014Surface Cleaning and Passivation of Chalcogenide Thin Films Using S(NH4)2 Chemical TreatmentBuffiere, Marie; El Mel, Abdel Aziz; Lenaers, Nick; BRAMMERTZ, Guy; Zaghi, Armin E.; MEURIS, Marc; POORTMANS, JefJournal ContributionA1
1022014Spectral current-voltage analysis of kesterite solar cellsBuffiere, M.; BRAMMERTZ, Guy; Oueslati, S.; El Anzeery, H.; Bekaert, Jonas; Ben Messaoud, Khaled; Köble, C.; Khelifi, S.; MEURIS, Marc; POORTMANS, JefJournal ContributionA1
1032014Microstructural analysis of 9.7% efficient Cu2ZnSnSe4 thin film solar cellsBuffiere, M.; BRAMMERTZ, Guy; Batuk, Maria; Verbist, C.; Mangin, Denis; Koble, C.; Hadermann, J.; MEURIS, Marc; POORTMANS, JefJournal ContributionA1
1042013Analysis of Border Traps in High-kappa Gate Dielectrics on High-Mobility ChannelsSimoen, E.; Lin, H. -C.; Alian, A.; BRAMMERTZ, Guy; Merckling, C.; Mitard, J.; Claeys, C.Proceedings PaperC1
1052013Border Traps in Ge/III–V Channel Devices: Analysis and Reliability AspectsSimoen, Eddy; Lin, Dennis Han-Chung; Alian, A.; BRAMMERTZ, Guy; Merckling, C.; Mitard, J.; Claeys, CorJournal ContributionA1
1062013Recombination Stability in Polycrystalline Cu2ZnSnSe4 Thin FilmsBuffiere, Marie; BRAMMERTZ, Guy; El Mel, Abdel-Aziz; Lenaers, Nick; Ren, Yi; Zaghi, Armin E.; Mols, Yves; Koeble, Christine; Vleugels, Jef; MEURIS, Marc; POORTMANS, JefProceedings PaperC1
1072013Correlation between physical, electrical, and optical properties of Cu2ZnSnSe4 based solar cellsBRAMMERTZ, Guy; Buffiere, M.; Mevel, Y.; Ren, Y.; Zaghi, A. E.; Lenaers, N.; Mols, Y.; Koeble, C.; Vleugels, J.; MEURIS, Marc; POORTMANS, JefJournal ContributionA1
1082013Characterization of defects in 9.7% efficient Cu2ZnSnSe4-CdS-ZnO solar cellsBRAMMERTZ, Guy; Buffiere, M.; Oueslati, S.; ElAnzeery, H.; Ben Messaoud, Khaled; Sahayaraj, S.; Koeble, C.; MEURIS, Marc; POORTMANS, JefJournal ContributionA1
1092013Electrical characterization of Cu2ZnSnSe4 solar cells from selenization of sputtered metal layersBRAMMERTZ, Guy; Ren, Yi; Buffiere, Marie; Mertens, Sofie; Hendrickx, Jurgen; Marko, Hakim; Zaghi, Armin E.; Lenaers, Nick; Koeble, Christine; Vleugels, Jef; MEURIS, Marc; POORTMANS, JefJournal ContributionA1
1102012Integration of III-V on Si for High-Mobility CMOSWaldron, Niamh; Wang, Gang; Nguyen, Ngoc Duy; Orzali, Tommaso; Merckling, Clement; Ong, Patrick; BRAMMERTZ, Guy; Eneman, Geert; Winderickx, Gillis; Caymax, Matty; Hellings, Geert; MEURIS, Marc; Horiguchi, Naoto; Thean, AaronProceedings PaperC1
1112012Trimethylaluminum-based Atomic Layer Deposition of MO2 (M=Zr, Hf): Gate Dielectrics on In0.53Ga0.47As(001) SubstratesMolle, A.; Cianci, E.; Lamperti, A.; Wiemer, C.; Baldovino, S.; Lamagna, L.; Spiga, S.; Fanciulli, M.; BRAMMERTZ, Guy; Merckling, C.; Caymax, M.Proceedings PaperC1
1122012Challenges for introducing Ge and III/V devices into CMOS technologiesHeyns, M.; Alian, A.; BRAMMERTZ, Guy; Caymax, M.; Eneman, G.; Franco, J.; Gencarelli, F.; Groeseneken, G.; Hellings, G.; Hikavyy, A.; Houssa, M.; Kaczer, B.; LIN, Dan; Loo, R.; Merckling, C.; MEURIS, Marc; Mitard, J.; Nyns, L.; Sioncke, S.; Vandervorst, W.; Vincent, B.; Waldron, N.; Witters, L.Proceedings PaperC1
1132012Preparation of micro flake ink for low cost printing of CIS-Se absorber layersZaghi, Armin. E.; BRAMMERTZ, Guy; Buffiere, Marie; Vanmeensel, Kim; MEURIS, Marc; POORTMANS, Jef; Vleugels, JefProceedings PaperC1
1142012Improved AC conductance and Gray-Brown methods to characterize fast and slow traps in Ge metal–oxide–semiconductor capacitorsSun, Xiao; Merckling, Clement; BRAMMERTZ, Guy; Lin, Dennis; Dekoster, Johan; Cui, Sharon; Ma, T. P.Journal ContributionA1
1152012AC Transconductance Dispersion (ACGD): A Method to Profile Oxide Traps in MOSFETs Without Body ContactSun, Xiao; Cui, Sharon; Alian, Alireza; BRAMMERTZ, Guy; Merckling, Clement; Lin, Dennis; Ma, T. P.Journal ContributionA1
1162012Oxide Trapping in the InGaAs-Al2O3 System and the Role of Sulfur in Reducing the Al2O3 Trap DensityAlian, Alireza; BRAMMERTZ, Guy; Degraeve, Robin; Cho, Moonju; Merckling, Clement; Lin, Dennis; Wang, Wei-E; Caymax, Matty; MEURIS, Marc; De Meyer, Kristin; Heyns, MarcJournal ContributionA1
1172012Integration of InGaAs Channel n-MOS Devices on 200mm Si Wafers Using the Aspect-Ratio-Trapping TechniqueWaldron, Niamh; Wang, Gang; Ngoc Duy Nguyen; Orzali, Tommaso; Merckling, Clement; BRAMMERTZ, Guy; Winderickx, Gillis; Hellings, Geert; Ong, Patrick; Eneman, Geert; Caymax, Matty; MEURIS, Marc; Horiguchi, Naoto; Thean, AaronProceedings PaperC1
1182012InGaAs MOS Transistors Fabricated through a Digital-Etch Gate-Recess Process and the Influence of Forming Gas Anneal on Their Electrical BehaviorAlian, Alireza; Merckling, Clement; BRAMMERTZ, Guy; MEURIS, Marc; Heyns, Marc; De Meyer, KristinJournal ContributionA1
1192011Electrical Characterization of the MOS (Metal-Oxide-Semiconductor) System: High Mobility SubstratesLin, Dennis; BRAMMERTZ, Guy; Sioncke, Sonja; Nyns, Laura; Alian, Alireza; Wang, Wei-E; Heyns, Marc; Caymax, Matty; Hoffmann, ThomasProceedings PaperC1
1202011Advancing CMOS beyond the Si roadmap with Ge and III/V devicesHeyns, M.; Alian, A.; BRAMMERTZ, Guy; Caymax, M.; Chang, Y. C.; Chu, L. K.; De Jaeger, B.; Eneman, G.; Gencarelli, F.; Groeseneken, G.; Hellings, G.; Hikavyy, A.; Hoffmann, T. Y.; Houssa, M.; Huyghebaert, C.; Leonelli, D.; Lin, D.; Loo, R.; Magnus, W.; Merckling, C.; MEURIS, Marc; Mitard, J.; Nyns, L.; Orzali, T.; Rooyackers, R.; Sioncke, S.; Soree, B.; Sun, X.; Vandooren, A.; Verhulst, A. S.; Vincent, B.; Waldron, N.; Wang, G.; Wang, W. E.; Witters, L.Proceedings PaperC1
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