D'OLIESLAEGER, Marc

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Full Name
D'OLIESLAEGER, Marc
Email
marc.dolieslaeger@uhasselt.be
 
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Publications

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Type:  Journal Contribution

Results 61-75 of 75 (Search time: 0.005 seconds).

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Issue DateTitleContributor(s)TypeCat.
611996Imaging of the ageing on organic electroluminescent diodes, under different atmospheres by impedance spectroscopy, scanning electron microscopy and SIMS depth profiling analysisBijnens, W; MANCA, Jean; WU, Ting-Di; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; GELAN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
621996Quantitative analysis of the compound layer of plasma nitrided pure ironD'HAEN, Jan; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
631996Study of the microstructure of IC interconnect metallisations using analytical transmission electron microscopy and secondary ion mass spectrometryCOSEMANS, Patrick Peter; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
641996Monte Carlo simulation of the formation of MCs(+) molecular ionsVLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
651996Investigation of n-doping in CVD diamond using gap states spectroscopyNESLADEK, Milos; MEYKENS, Kristien; STALS, Lambert; QUAEYHAEGENS, Carl; D'OLIESLAEGER, Marc; WU, Ting-Di; Vanecek, M; Rosa, JJournal Contribution
661995Structure analysis of plasma nitrited pure ironD'HAEN, Jan; QUAEYHAEGENS, Carl; KNUYT, Gilbert; D'OLIESLAEGER, Marc; STALS, LambertJournal Contribution
671995Lateral and vertical dopant profiling in semiconductors by atomic force microscopy using conducting tipsde Wolf, P.; Clarysse, T.; Vandervorst, W.; Snauwaert, J.; Hellemans, L.; D'OLIESLAEGER, Marc; QUAEYHAEGENS, CarlJournal Contribution
681995Influence of the presence of white layers formed during grinding and wire-electro-discharge machining on PVD TiN coating adhesionPALMERS, J; VANSTAPPEN, M; D'HAEN, Jan; D'OLIESLAEGER, Marc; STALS, Lambert; UHLIG, G; FOLLER, M; HABERLING, EJournal Contribution
691995In-situ failure-detection in thick-film multilayer systemsMANCA, Jean; DE SCHEPPER, Luc; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; STALS, LambertJournal Contribution
701994The performance of (Ti,Al)N-coated flowdrillsKERKHOFS, M; VANSTAPPEN, M; D'OLIESLAEGER, Marc; QUAEYHAEGENS, Carl; STALS, LambertJournal Contribution
711994Investigation of the CVD diamond intermediate layer steel interfaceNESLADEK, Milos; Asinari, C.; SPINNEWYN, J; LEBOUT, R; LORENT, R; D'OLIESLAEGER, MarcJournal Contribution
721993Electromigration - Investigation of heterogeneous systemsVANHECKE, B; DE SCHEPPER, Luc; DE CEUNINCK, Ward; DHAEGER, V; D'OLIESLAEGER, Marc; BEYNE, E; ROGGEN, J; STALS, LambertJournal Contribution
731992The influence of current stress on the aging of Au-all-percent-Si(1-percent-Cu) ball-bond contacts studied by SEM and EDXD'OLIESLAEGER, Marc; DE SCHEPPER, Luc; DE CEUNINCK, Ward; STALS, LambertJournal Contribution
741991Atomistic computer-simulation of the growth of helium platelets in nickelD'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
751991Stability of helium-filled platelets in nickelD'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
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