MANCA, Jean

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Full Name
MANCA, Jean
Email
jean.manca@uhasselt.be
 
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Publications

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Date Issued:  [2000 TO 2009]

Results 61-68 of 68 (Search time: 0.003 seconds).

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Issue DateTitleContributor(s)TypeCat.
612002Recent progresses of the BOLD investigation towards UV detectors for the ESA Solar OrbiterHochedez, JF; Alvarez, J.; Auret, F.D.; Bergonzo, P; Castex, MC; Deneuville, A; Defise, JM; Fleck, B; Gibart, P; Goodman, SA; Hainaut, O; Kleider, JP; Lemaire, P; Monroy, E; Munoz, E; Muret, P; Omnes, F; Pace, E; Pau, JL; Ralchenko, V; Roggen, J; Schuhle, U; Van Hoof, C; MANCA, Jean; NESLADEK, MilosJournal ContributionA1
622002High-resolution SILC measurements of thin SiO2 ultra low voltagesARESU, Stefano; DE CEUNINCK, Ward; DREESEN, Raf; CROES, Kristof; ANDRIES, Ellen; MANCA, Jean; DE SCHEPPER, Luc; DEGRAEVE, Maria; Kaczer, B.; D'OLIESLAEGER, Marc; D'HAEN, JanJournal ContributionA1
632001Study of UV and subgap photocurrent response in diamond and BCN thin films for detector applicationsNESLADEK, Milos; Vanecek, M; MEYKENS, Kristien; HAENEN, Ken; MANCA, Jean; DE SCHEPPER, Luc; Pace, E; Pini, A; Rinati, GV; Kimura, C; Etou, Y; Sugino, TJournal ContributionA1
642001A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradationDREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, GJournal ContributionA1
652001High-resolution in-situ study of gold electromigration: test time reductionCROES, Kristof; DREESEN, Raf; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Van der Wel, PJournal ContributionA1
662000Reliability aspects of high temperature power MOSFETsMANCA, Jean; Wondrak, W; Schaper, W; CROES, Kristof; D'HAEN, Jan; DE CEUNINCK, Ward; Dieval, B; Hartnagel, HL; D'OLIESLAEGER, Marc; DE SCHEPPER, LucJournal ContributionA1
672000The stability of Pt heater and temperature sensing elements for silicon integrated tin oxide gas sensorsEsch, H; Huyberechts, G; Mertens, R.; Maes, Guido; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, LucJournal ContributionA1
682000In-situ SEM observation of electromigration in thin metal films at accelerated stress conditionsD'HAEN, Jan; VAN OLMEN, Jan; BEELEN, Zjef; MANCA, Jean; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Cannaerts, M; Maex, KJournal ContributionA1
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