LEKENS, Geert

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Full Name
LEKENS, Geert
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geert.lekens@uhasselt.be
 
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Publications

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Date Issued:  [2000 TO 2009]

Results 1-6 of 6 (Search time: 0.002 seconds).

Issue DateTitleContributor(s)TypeCat.
12007Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperatureMOONEN, Rob; Vanmeerbeek, P; LEKENS, Geert; DE CEUNINCK, Ward; Moens, P.; Boutsen, J.Proceedings PaperC1
22007Lifetime modeling of intrinsic gate oxide breakdown at high temperatureMOONEN, Rob; Vanmeerbeek, P; LEKENS, Geert; DE CEUNINCK, Ward; Moens, P.; BOUTSEN, JanJournal ContributionA1
32005Failure mechanisms and qualification testing of passive componentsPost, H.A.; Letullier, P.; Briolat, T.; Humke, R.; Schuhmann, R.; Saarinen, K.; Werner, W.; Ousten, Y.; LEKENS, Geert; Dehbi, A.; Wondrak, W.Journal ContributionA1
42003Advantage of in-situ to ex-situ techniques as reliability tool: aging kinetcs of Imec's MCM-D discrete passive devicesSoussan, P.; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward; Beyne, E.Proceedings PaperC2
52003Moisture induced failures in flip chip on flex interconnections using anisotropic conductive adhesivesLEKENS, Geert; DREESEN, Raf; CROES, Kristof; Caers, J.F.J.M.; Zhao, X.J.; Wong, E.H.Proceedings PaperC2
62003Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices.Soussan, P; LEKENS, Geert; DREESEN, Raf; DE CEUNINCK, Ward; Beyne, EJournal ContributionA1