DE SCHEPPER, Luc

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Full Name
DE SCHEPPER, Luc
Email
luc.deschepper@uhasselt.be
 
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Publications

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Date Issued:  [2000 TO 2005]

Results 21-32 of 32 (Search time: 0.004 seconds).

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Issue DateTitleContributor(s)TypeCat.
212001Reversible switching of the surface conductance of hydrogenated CVD diamond filmsCannaerts, M; NESLADEK, Milos; HAENEN, Ken; STALS, Lambert; DE SCHEPPER, Luc; Van Haesendonck, CJournal ContributionA1
222001Origin of hydrogen-related surface conductivity in chemical vapor deposited diamond filmsCannaerts, M.; NESLADEK, Milos; HAENEN, Ken; DE SCHEPPER, Luc; Maslova, N.S.; van Haesendonck, C.Journal ContributionA3
232001Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluationPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Vendier, O; Blanck, H; Pons, DJournal ContributionA1
242001A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradationDREESEN, Raf; CROES, Kristof; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Pergoot, A; Groeseneken, GJournal ContributionA1
252001High-resolution in-situ study of gold electromigration: test time reductionCROES, Kristof; DREESEN, Raf; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Van der Wel, PJournal ContributionA1
262000A novel non-destructive method for assessing the thermal resistance of power GaAs RF-MMIC amplifiersPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, LucProceedings PaperC1
272000Reliability aspects of high temperature power MOSFETsMANCA, Jean; Wondrak, W; Schaper, W; CROES, Kristof; D'HAEN, Jan; DE CEUNINCK, Ward; Dieval, B; Hartnagel, HL; D'OLIESLAEGER, Marc; DE SCHEPPER, LucJournal ContributionA1
282000The stability of Pt heater and temperature sensing elements for silicon integrated tin oxide gas sensorsEsch, H; Huyberechts, G; Mertens, R.; Maes, Guido; MANCA, Jean; DE CEUNINCK, Ward; DE SCHEPPER, LucJournal ContributionA1
292000Investigation of the formation process of MCs+-molecular ions during sputteringVLEKKEN, Johan; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W; DE SCHEPPER, LucJournal ContributionA1
302000Investigation of the formation of sputtered oxide clusters with the Laser Assisted Sputtered Neutral Mass Spectroscopy technique (LASNMS)VLEKKEN, Johan; POLUS, Dany; D'OLIESLAEGER, Marc; Vandervorst, W.; DE SCHEPPER, LucProceedings PaperC2
312000In-situ SEM observation of electromigration in thin metal films at accelerated stress conditionsD'HAEN, Jan; VAN OLMEN, Jan; BEELEN, Zjef; MANCA, Jean; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Cannaerts, M; Maex, KJournal ContributionA1
322000A method to minimize test times for accelerated testing of pHEMT's by analysis of the elctronic fingerprint of the initial stage of degradationPETERSEN, Rainer; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Muraro, J.-L.Journal ContributionA1
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