DE SCHEPPER, Luc

Email Alert RSS Feed

Profile

Full Name
DE SCHEPPER, Luc
Email
luc.deschepper@uhasselt.be
 
Loading... 5 0 5 0 false
Loading... 6 0 5 0 false

Publications

Refined By:
Date Issued:  [1991 TO 1999]
Author:  D'OLIESLAEGER, Marc

Results 1-19 of 19 (Search time: 0.006 seconds).

Issue DateTitleContributor(s)TypeCat.
11999Dynamics of electromigration induced void/hillock growth and precipitation/dissolution of addition elements studied by in-situ scanning electron microscopy resistance measurementsD'HAEN, Jan; COSEMANS, Patrick Peter; MANCA, Jean; LEKENS, Geert; MARTENS, Tom; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; Maex, KJournal Contribution
21999Investigation of the formation of M-2(+)-molecular ions in sputtering processesVLEKKEN, Johan; CROES, Kristof; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W; DE SCHEPPER, LucJournal Contribution
31998Monte Carlo simulation of the formation of M2+-molecular ions sputtered from metallic materialsVLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; Vandervorst, W.Proceedings Paper
41998Investigation of correlations between parameters defining the state of sputtered particlesVLEKKEN, Johan; CROES, Kristof; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W.; DE SCHEPPER, LucProceedings Paper
51998Analysis of the operating conditions of ETP electron multipliers used on Cameca IMS instrumentsWU, Ting-Di; VLEKKEN, Johan; D'OLIESLAEGER, Marc; DE SCHEPPER, LucProceedings Paper
61998Study of Cu diffusion in an Al-1 wt%Si-0.5 wt%Cu bond pad with an Al-1 wt%Si bond wire attached using scanning electron microscopyCOSEMANS, Patrick; D'HAEN, Jan; Witvrouw, A; Proost, J; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; Maex, K; DE SCHEPPER, LucJournal Contribution
71998Quantitation of major elements with secondary ion mass spectrometry by using M-2(+)-molecular ionsVLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; Vandervorst, W; DE SCHEPPER, LucJournal Contribution
81998Evaluation of the energy selection optics of Cameca IMS instruments using Fast Fourier Transforms (FFT)VLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, LucProceedings Paper
91998Effect of oxygen on the electrical characteristics of PPV-LEDsMANCA, Jean; Bijnens, W; KIEBOOMS, Rafael; D'HAEN, Jan; D'OLIESLAEGER, Marc; WU, Ting-Di; DE CEUNINCK, Ward; DE SCHEPPER, Luc; VANDERZANDE, Dirk; GELAN, Jan; STALS, MarkJournal Contribution
101998Electrical field induced ageing of polymer light-emitting diodes in an oxygen-rich atmosphere studied by emission microscopy, scanning electron microscopy and secondary ion mass spectroscopyBijnens, W; De Wolf, I; MANCA, Jean; D'HAEN, Jan; WU, Ting-Di; D'OLIESLAEGER, Marc; Beyne, E; KIEBOOMS, Rafael; VANDERZANDE, Dirk; GELAN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
111996Quantitative analysis of the compound layer of plasma nitrided pure ironD'HAEN, Jan; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
121996Monte Carlo simulation of the formation of MCs(+) molecular ionsVLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
131996Study of the microstructure of IC interconnect metallisations using analytical transmission electron microscopy and secondary ion mass spectrometryCOSEMANS, Patrick Peter; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
141996Imaging of the ageing on organic electroluminescent diodes, under different atmospheres by impedance spectroscopy, scanning electron microscopy and SIMS depth profiling analysisBijnens, W; MANCA, Jean; WU, Ting-Di; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; GELAN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
151995IN-SITU FAILURE-DETECTION IN THICK-FILM MULTILAYER SYSTEMSMANCA, Jean; DE SCHEPPER, Luc; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; STALS, LambertJournal Contribution
161993ELECTROMIGRATION - INVESTIGATION OF HETEROGENEOUS SYSTEMSVANHECKE, B; DE SCHEPPER, Luc; DE CEUNINCK, Ward; DHAEGER, V; D'OLIESLAEGER, Marc; BEYNE, E; ROGGEN, J; STALS, LambertJournal Contribution
171992THE INFLUENCE OF CURRENT STRESS ON THE AGING OF AU-ALL-PERCENT-SI(1-PERCENT-CU) BALL-BOND CONTACTS STUDIED BY SEM AND EDXD'OLIESLAEGER, Marc; DE SCHEPPER, Luc; DE CEUNINCK, Ward; STALS, LambertJournal Contribution
181991STABILITY OF HELIUM-FILLED PLATELETS IN NICKELD'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
191991ATOMISTIC COMPUTER-SIMULATION OF THE GROWTH OF HELIUM PLATELETS IN NICKELD'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution