DE SCHEPPER, Luc

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Full Name
DE SCHEPPER, Luc
Email
luc.deschepper@uhasselt.be
 
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Publications

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Date Issued:  [1991 TO 1999]
Type:  Journal Contribution

Results 21-40 of 43 (Search time: 0.003 seconds).

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Issue DateTitleContributor(s)TypeCat.
211997Design of a new test structure for the study of electromigration with early resistance change measurementsDE CEUNINCK, Ward; MANCA, Jean; D'Haeger, V; VAN OLMEN, Jan; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
221996Evaluation on a two-day time scale of high-reliability electronic assemblies by in-situ electrical and opto-mechanical test techniquesGregoris, G.; Bouton, F.; DeKeukeleire, C.; Siliprandi, P.; Baio, F.; DE SCHEPPER, Luc; DE CEUNINCK, Ward; Tielemans, L.; Ahrens, T.; Krumm, M.Journal Contribution
231996A new technique to characterize the early stages of electromigration-induced resistance changes at low current densitiesDHaeger, V; DE CEUNINCK, Ward; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
241996Quantitative analysis of the compound layer of plasma nitrided pure ironD'HAEN, Jan; D'OLIESLAEGER, Marc; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
251996Monte Carlo simulation of the formation of MCs(+) molecular ionsVLEKKEN, Johan; WU, Ting-Di; D'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
261996Study of the microstructure of IC interconnect metallisations using analytical transmission electron microscopy and secondary ion mass spectrometryCOSEMANS, Patrick Peter; D'OLIESLAEGER, Marc; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
271996A re-interpretation of the existence of a spectrum of activation energies for the microstructural changes in Al 1% Si linesStulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
281996Imaging of the ageing on organic electroluminescent diodes, under different atmospheres by impedance spectroscopy, scanning electron microscopy and SIMS depth profiling analysisBijnens, W; MANCA, Jean; WU, Ting-Di; D'OLIESLAEGER, Marc; VANDERZANDE, Dirk; GELAN, Jan; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
291995IN-SITU FAILURE-DETECTION IN THICK-FILM MULTILAYER SYSTEMSMANCA, Jean; DE SCHEPPER, Luc; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; STALS, LambertJournal Contribution
301994The use of early resistance and early tcr changes to predict the reliability of on-chip interconnectsD'Haeger, V; Stulens, Herwig; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Gallopyn, G; Depauw P; STALS, LambertJournal Contribution
311994An activation-energy study of the microstructural changes in al-1-percent-si interconnectsStulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
321993AN INTERFACE STUDY OF VARIOUS PVD TIN COATINGS ON PLASMA-NITRIDED AUSTENITIC STAINLESS-STEEL AISI 304D'HAEN, Jan; QUAEYHAEGENS, Carl; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, Lambert; VANSTAPPEN, MJournal Contribution
331993ELECTROMIGRATION - INVESTIGATION OF HETEROGENEOUS SYSTEMSVANHECKE, B; DE SCHEPPER, Luc; DE CEUNINCK, Ward; DHAEGER, V; D'OLIESLAEGER, Marc; BEYNE, E; ROGGEN, J; STALS, LambertJournal Contribution
341992THE INFLUENCE OF CURRENT STRESS ON THE AGING OF AU-ALL-PERCENT-SI(1-PERCENT-CU) BALL-BOND CONTACTS STUDIED BY SEM AND EDXD'OLIESLAEGER, Marc; DE SCHEPPER, Luc; DE CEUNINCK, Ward; STALS, LambertJournal Contribution
351991INTERFACE STUDY OF TIN-COATED AND TI-TIN-COATED STAINLESS-STEEL AISI-304 WITH ASYMMETRIC GLANCING ANGLE X-RAY-DIFFRACTION AND CLASSICAL BRAGG-BRENTANO X-RAY-DIFFRACTIONQUAEYHAEGENS, Carl; STALS, Lambert; DE SCHEPPER, Luc; VAN STAPPEN, MJournal Contribution
361991DETERMINATION OF THE ATTEMPT FREQUENCY FOR RELAXATION PHENOMENA IN AMORPHOUS METALSDE CEUNINCK, Ward; KNUYT, Gilbert; Stulens, Herwig; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
371991STABILITY OF HELIUM-FILLED PLATELETS IN NICKELD'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
381991CALCULATION OF SOME METALLIC-GLASS PROPERTIES, BASED ON THE USE OF A GAUSSIAN DISTRIBUTION FOR THE NEAREST-NEIGHBOR DISTANCE .2. DIFFUSION AND VISCOSITY PROPERTIESKNUYT, Gilbert; STALS, Lambert; DE SCHEPPER, LucJournal Contribution
391991ATOMISTIC COMPUTER-SIMULATION OF THE GROWTH OF HELIUM PLATELETS IN NICKELD'OLIESLAEGER, Marc; KNUYT, Gilbert; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
401991CALCULATION OF THE SHEAR MODULUS PROPERTIES OF AMORPHOUS-ALLOYSSTALS, Lambert; DE SCHEPPER, Luc; DE CEUNINCK, Ward; KNUYT, GilbertJournal Contribution
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