DE CEUNINCK, Ward

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DE CEUNINCK, Ward
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ward.deceuninck@uhasselt.be
 
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Publications

Results 101-114 of 114 (Search time: 0.003 seconds).

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Issue DateTitleContributor(s)TypeCat.
1011996Evaluation on a two-day time scale of high-reliability electronic assemblies by in-situ electrical and opto-mechanical test techniquesGregoris, G.; Bouton, F.; DeKeukeleire, C.; Siliprandi, P.; Baio, F.; DE SCHEPPER, Luc; DE CEUNINCK, Ward; Tielemans, L.; Ahrens, T.; Krumm, M.Journal Contribution
821995In-situ failure-detection in thick-film multilayer systemsMANCA, Jean; DE SCHEPPER, Luc; DE CEUNINCK, Ward; D'OLIESLAEGER, Marc; STALS, LambertJournal Contribution
831995Evaluation on a two days time scale of high reliability electronic assemblies by in-situ electrical and optomechanical tests techniquesGregoris, G.; Bouton, F.; de Keukeleire, C.; Siliprandi, P.; Baio, F.; DE SCHEPPER, Luc; DE CEUNINCK, Ward; Tielemans, L.; Ahrens, T.; Krumm, M.Proceedings Paper
841994An activation-energy study of the microstructural changes in al-1-percent-si interconnectsStulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
851994The use of early resistance and early tcr changes to predict the reliability of on-chip interconnectsD'Haeger, V; Stulens, Herwig; DE CEUNINCK, Ward; DE SCHEPPER, Luc; Tielemans, L; Gallopyn, G; Depauw P; STALS, LambertJournal Contribution
861994Reliability study of on-chip interconnects - prediction of electromigration resistance on a short-time scaleDE CEUNINCK, Ward; D'Haeger, V; Stulens, Herwig; DE SCHEPPER, Luc; STALS, LambertProceedings Paper
871993Electromigration - Investigation of heterogeneous systemsVANHECKE, B; DE SCHEPPER, Luc; DE CEUNINCK, Ward; DHAEGER, V; D'OLIESLAEGER, Marc; BEYNE, E; ROGGEN, J; STALS, LambertJournal Contribution
881993Derivation of an activation-energy spectrum for defect processes from isothermal measurements, using a minimization principle and Fourier-analysisKNUYT, Gilbert; Stulens, Herwig; DE CEUNINCK, Ward; STALS, LambertJournal Contribution
891992The influence of current stress on the aging of Au-all-percent-Si(1-percent-Cu) ball-bond contacts studied by SEM and EDXD'OLIESLAEGER, Marc; DE SCHEPPER, Luc; DE CEUNINCK, Ward; STALS, LambertJournal Contribution
901992A simple method of calculating an energy-spectrum from isothermal measurements, using Fourier techniquesKNUYT, Gilbert; Stulens, Herwig; DE CEUNINCK, Ward; BEX, Geert Jan; STALS, LambertJournal Contribution
911992A simple method for calculating an energy-spectrum for defect annealing from a constant heating rate experimentStulens, Herwig; KNUYT, Gilbert; DE CEUNINCK, Ward; STALS, LambertJournal Contribution
921991Calculation of the shear modulus properties of amorphous-alloysSTALS, Lambert; DE SCHEPPER, Luc; DE CEUNINCK, Ward; KNUYT, GilbertJournal Contribution
931991A new explanation for the linear increase of viscosity with time in amorphous-alloysKNUYT, Gilbert; STALS, Lambert; DE SCHEPPER, Luc; DE CEUNINCK, WardJournal Contribution
941991Determination of the attempt frequency for relaxation phenomena in amorphous metalsDE CEUNINCK, Ward; KNUYT, Gilbert; Stulens, Herwig; DE SCHEPPER, Luc; STALS, LambertJournal Contribution
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